Morphology enhancement of SiO2 aerogel films grown on Si substrate using dense SiO2 buffer layer

Porous SiO 2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO 2 film made by traditional sol–gel method. Bare Si and Si with SiO 2 buffer layer were used as substrate. The SiO 2 buffer layer was 500 nm in thickness and was...

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Published inRare metals Vol. 42; no. 7; pp. 2457 - 2461
Main Authors Sun, Xiang-Yu, Wu, Chuan-Gui, Luo, Wen-Bo, Shuai, Yao, Zhang, Wang-Li
Format Journal Article
LanguageEnglish
Published Beijing Nonferrous Metals Society of China 01.07.2023
Springer Nature B.V
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Abstract Porous SiO 2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO 2 film made by traditional sol–gel method. Bare Si and Si with SiO 2 buffer layer were used as substrate. The SiO 2 buffer layer was 500 nm in thickness and was grown by thermal oxidization. The structural properties of SiO 2 aerogel films spin-coated on both materials were observed by optical microscope (OM) and scanning electron microscope (SEM). Results reveal that the surface of SiO 2 aerogel films on bare Si is rough and discontinuous. While flat and smooth surface is observed on sample with SiO 2 buffer layer. This indicates that by inserting SiO 2 buffer layer, the structural property of SiO 2 aerogel film deposited on Si is improved.
AbstractList Porous SiO 2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO 2 film made by traditional sol–gel method. Bare Si and Si with SiO 2 buffer layer were used as substrate. The SiO 2 buffer layer was 500 nm in thickness and was grown by thermal oxidization. The structural properties of SiO 2 aerogel films spin-coated on both materials were observed by optical microscope (OM) and scanning electron microscope (SEM). Results reveal that the surface of SiO 2 aerogel films on bare Si is rough and discontinuous. While flat and smooth surface is observed on sample with SiO 2 buffer layer. This indicates that by inserting SiO 2 buffer layer, the structural property of SiO 2 aerogel film deposited on Si is improved.
Porous SiO2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO2 film made by traditional sol–gel method. Bare Si and Si with SiO2 buffer layer were used as substrate. The SiO2 buffer layer was 500 nm in thickness and was grown by thermal oxidization. The structural properties of SiO2 aerogel films spin-coated on both materials were observed by optical microscope (OM) and scanning electron microscope (SEM). Results reveal that the surface of SiO2 aerogel films on bare Si is rough and discontinuous. While flat and smooth surface is observed on sample with SiO2 buffer layer. This indicates that by inserting SiO2 buffer layer, the structural property of SiO2 aerogel film deposited on Si is improved.
Author Luo, Wen-Bo
Shuai, Yao
Zhang, Wang-Li
Wu, Chuan-Gui
Sun, Xiang-Yu
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Rare Metals is a copyright of Springer, (2019). All Rights Reserved.
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– notice: The Nonferrous Metals Society of China and Springer-Verlag GmbH Germany, part of Springer Nature 2019.
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Si substrate
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buffer layer
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Snippet Porous SiO 2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO 2 film made by...
Porous SiO2 film has been widely studied due to its extensive applications in many fields. This paper presents a newly produced porous SiO2 film made by...
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SubjectTerms Aerogels
Biomaterials
Buffer layers
Chemistry and Materials Science
Energy
Materials Engineering
Materials Science
Metallic Materials
Morphology
Nanoscale Science and Technology
Optical microscopes
Physical Chemistry
Silicon dioxide
Silicon substrates
Sol-gel processes
Spin coating
Temperature
Title Morphology enhancement of SiO2 aerogel films grown on Si substrate using dense SiO2 buffer layer
URI https://link.springer.com/article/10.1007/s12598-018-1185-9
https://www.proquest.com/docview/2295834927
https://www.proquest.com/docview/2828889566
Volume 42
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