Reduced damage threshold for tungsten using combined steady state and transient sources
Divertor wall materials in future fusion devices will be subject to both high flux steady state plasma and transient ELM striking which could limit the lifetime of these plasma facing materials. A pulsed plasma source was therefore developed to reproduce these conditions. Laser irradiation of simila...
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Published in | Journal of nuclear materials Vol. 438; pp. S784 - S787 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
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Elsevier B.V
01.07.2013
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Abstract | Divertor wall materials in future fusion devices will be subject to both high flux steady state plasma and transient ELM striking which could limit the lifetime of these plasma facing materials. A pulsed plasma source was therefore developed to reproduce these conditions. Laser irradiation of similar pulse length has been used to disambiguate between the effects of particle and heat loads compared with transient heating alone. A lowered threshold for damage of tungsten was observed in the case of simultaneous transient and steady state loads compared to transients alone, while surface damage was also enhanced with repeated laser irradiation following steady plasma exposure, compared to the two processes individually, indicating a synergistic enhancement of surface modification due to plasma exposure. |
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AbstractList | Divertor wall materials in future fusion devices will be subject to both high flux steady state plasma and transient ELM striking which could limit the lifetime of these plasma facing materials. A pulsed plasma source was therefore developed to reproduce these conditions. Laser irradiation of similar pulse length has been used to disambiguate between the effects of particle and heat loads compared with transient heating alone. A lowered threshold for damage of tungsten was observed in the case of simultaneous transient and steady state loads compared to transients alone, while surface damage was also enhanced with repeated laser irradiation following steady plasma exposure, compared to the two processes individually, indicating a synergistic enhancement of surface modification due to plasma exposure. |
Author | De Temmerman, G. Morgan, T.W. Zielinski, J.J. Xu, H.Y. Hensen, B.J. Marot, L. |
Author_xml | – sequence: 1 givenname: T.W. surname: Morgan fullname: Morgan, T.W. email: t.w.morgan@differ.nl organization: FOM Institute for Plasma Physics, Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands – sequence: 2 givenname: J.J. surname: Zielinski fullname: Zielinski, J.J. organization: FOM Institute for Plasma Physics, Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands – sequence: 3 givenname: B.J. surname: Hensen fullname: Hensen, B.J. organization: FOM Institute for Plasma Physics, Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands – sequence: 4 givenname: H.Y. surname: Xu fullname: Xu, H.Y. organization: Department of Materials Science and Engineering, Tsinghua University, Beijing 100084, China – sequence: 5 givenname: L. surname: Marot fullname: Marot, L. organization: Department of Physics, University of Basel, Klingelberstrasse 82, CH-4056 Basel, Switzerland – sequence: 6 givenname: G. surname: De Temmerman fullname: De Temmerman, G. organization: FOM Institute for Plasma Physics, Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands |
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CitedBy_id | crossref_primary_10_1016_j_jnucmat_2020_152776 crossref_primary_10_1016_j_fusengdes_2014_02_078 crossref_primary_10_1088_1674_1056_ac3395 crossref_primary_10_1088_0029_5515_54_12_123010 crossref_primary_10_1088_0029_5515_56_8_086007 crossref_primary_10_1016_j_fusengdes_2013_05_047 crossref_primary_10_1088_1402_4896_aa8784 crossref_primary_10_1016_j_jnucmat_2014_11_002 crossref_primary_10_1088_1741_4326_ab77e7 crossref_primary_10_1088_0029_5515_55_11_113015 crossref_primary_10_1088_0031_8949_2014_T159_014036 |
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SubjectTerms | Damage Flux Irradiation Lasers Steady state Thresholds Tungsten Walls |
Title | Reduced damage threshold for tungsten using combined steady state and transient sources |
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