Lifetime Evaluation of Three-Level Inverters for 1500-V Photovoltaic Systems
The installation cost of photovoltaic (PV) plants can be reduced considerably by extending the maximum dc voltage from 1000 to 1500 V (e.g., with more PV arrays connected in series). However, the increased dc voltage also presents challenges on the design and operation of PV inverters in terms of ef...
Saved in:
Published in | IEEE journal of emerging and selected topics in power electronics Vol. 9; no. 4; pp. 4285 - 4298 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Piscataway
IEEE
01.08.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | The installation cost of photovoltaic (PV) plants can be reduced considerably by extending the maximum dc voltage from 1000 to 1500 V (e.g., with more PV arrays connected in series). However, the increased dc voltage also presents challenges on the design and operation of PV inverters in terms of efficiency and reliability. To ensure an efficient and reliable PV power conversion, an early stage reliability assessment is of importance in the design phase of the inverter and then the entire system. This article, thus, evaluates the lifetime of three-level 1500-V PV inverters with respect to their thermal cycling capabilities both at the component level and system level. The evaluation is carried out through a case study on a 160-kW PV system considering the impact of voltage stress, switching frequency, and mission profile. The evaluation reveals that these factors have a significant impact on the inverter reliability and thus affect the topology selection and the final cost of the entire PV system. More importantly, the exploration provides insights on the design of 1500-V PV systems seen from the reliability perspective. |
---|---|
AbstractList | The installation cost of photovoltaic (PV) plants can be reduced considerably by extending the maximum dc voltage from 1000 to 1500 V (e.g., with more PV arrays connected in series). However, the increased dc voltage also presents challenges on the design and operation of PV inverters in terms of efficiency and reliability. To ensure an efficient and reliable PV power conversion, an early stage reliability assessment is of importance in the design phase of the inverter and then the entire system. This article, thus, evaluates the lifetime of three-level 1500-V PV inverters with respect to their thermal cycling capabilities both at the component level and system level. The evaluation is carried out through a case study on a 160-kW PV system considering the impact of voltage stress, switching frequency, and mission profile. The evaluation reveals that these factors have a significant impact on the inverter reliability and thus affect the topology selection and the final cost of the entire PV system. More importantly, the exploration provides insights on the design of 1500-V PV systems seen from the reliability perspective. |
Author | Iannuzzo, Francesco Sangwongwanich, Ariya He, Jinkui Yang, Yongheng |
Author_xml | – sequence: 1 givenname: Jinkui orcidid: 0000-0002-3161-561X surname: He fullname: He, Jinkui email: jhe@et.aau.dk organization: Department of Energy Technology, Aalborg University, Aalborg, Denmark – sequence: 2 givenname: Ariya orcidid: 0000-0002-2587-0024 surname: Sangwongwanich fullname: Sangwongwanich, Ariya email: ars@et.aau.dk organization: Department of Energy Technology, Aalborg University, Aalborg, Denmark – sequence: 3 givenname: Yongheng orcidid: 0000-0002-1488-4762 surname: Yang fullname: Yang, Yongheng email: yoy@et.aau.dk organization: Department of Energy Technology, Aalborg University, Aalborg, Denmark – sequence: 4 givenname: Francesco orcidid: 0000-0003-3949-2172 surname: Iannuzzo fullname: Iannuzzo, Francesco email: fia@et.aau.dk organization: Department of Energy Technology, Aalborg University, Aalborg, Denmark |
BookMark | eNo9kE1rwkAQQJdiodb6C7ws9Bw7u5v9yLGIbS2BCtpel3xMMBKzdjcG-u-rRDzNHN6bgfdIRq1rkZAZgzljkLx8Ljfb9XLOgcNcABgeqzsy5kyZSGkjR7dd6wcyDWEPcKFkos2YpGldYVcfkC77rDllXe1a6iq63XnEKMUeG7pqe_Qd-kAr5ymTANEPXe9c53rXdFld0M1f6PAQnsh9lTUBp9c5Id9vy-3iI0q_3leL1zQqRMy7iMWKlSgAZVIAk5kwTOYyrnIsc6WhEqzQiZZC80KWhRImy2UJaHjCSmmSREzI83D36N3vCUNn9-7k2_NLy6VUsVGg4EyJgSq8C8FjZY--PmT-zzKwl3J2KGcv5ey13NmaDVaNiDcjYUIrCeIfL_dqHQ |
CODEN | IJESN2 |
CitedBy_id | crossref_primary_10_1109_OJPEL_2021_3116070 crossref_primary_10_3390_app13053155 crossref_primary_10_1016_j_microrel_2022_114723 crossref_primary_10_1109_TTE_2022_3216581 crossref_primary_10_1016_j_egyr_2022_10_186 crossref_primary_10_1109_TIE_2022_3203768 crossref_primary_10_1109_JESTPE_2021_3103252 crossref_primary_10_1016_j_microrel_2022_114639 crossref_primary_10_1109_TPEL_2023_3323032 crossref_primary_10_3390_en15239104 crossref_primary_10_3390_en15218108 crossref_primary_10_1109_ACCESS_2023_3263526 crossref_primary_10_1109_TIE_2022_3231265 crossref_primary_10_1109_TPEL_2023_3328438 crossref_primary_10_1080_15325008_2023_2210565 crossref_primary_10_1109_ACCESS_2021_3108188 crossref_primary_10_1109_TPEL_2022_3146277 crossref_primary_10_1007_s43236_023_00626_y crossref_primary_10_1016_j_microrel_2022_114650 crossref_primary_10_1051_e3sconf_202339101173 crossref_primary_10_1109_TIA_2022_3204736 |
Cites_doi | 10.1109/TPEL.2016.2582344 10.1109/TPEL.2017.2665697 10.1109/TPEL.2015.2509643 10.1109/TPEL.2019.2962503 10.1109/PEAC.2014.7038066 10.1109/TPEL.2014.2325891 10.1049/cp.2014.0475 10.1109/TIA.2019.2947227 10.1109/TPEL.2017.2769161 10.1109/JESTPE.2015.2445735 10.1109/TPEL.2006.876867 10.1109/TPEL.2014.2332754 10.1109/JESTPE.2016.2566259 10.1109/PEDS.1997.618742 10.1109/JESTPE.2019.2893106 10.1109/CPERE45374.2019.8980134 10.1109/EPE.2015.7311717 10.1109/TPEL.2016.2573823 10.1109/TIE.2016.2549503 10.1109/TPEL.2017.2678169 10.1109/JESTPE.2015.2428432 10.1109/IECON.2017.8216208 10.24295/CPSSTPEA.2016.00009 10.1109/TIA.2018.2825955 10.1109/TIE.2012.2233698 10.24295/CPSSTPEA.2018.00009 10.1109/TPEL.2012.2198670 10.1109/TEC.2013.2252013 10.1115/1.4009458 10.1109/TPEL.2012.2229472 10.1109/TEC.2018.2879217 10.1109/PEDG.2016.7527028 10.1109/APEC.2010.5433438 10.1109/EPE.2013.6631986 10.1109/TPEL.2019.2893636 10.1109/MPEL.2018.2874509 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
DBID | 97E RIA RIE AAYXX CITATION 7SP 8FD L7M |
DOI | 10.1109/JESTPE.2020.3008246 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
DatabaseTitle | CrossRef Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
DatabaseTitleList | Technology Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 2168-6785 |
EndPage | 4298 |
ExternalDocumentID | 10_1109_JESTPE_2020_3008246 9137650 |
Genre | orig-research |
GrantInformation_xml | – fundername: Reliable Power Electronic based Power Systems (REPEPS) – fundername: The Velux Foundations under the Villum Investigator grantid: 00016591 |
GroupedDBID | 0R~ 4.4 6IK 97E AAJGR AASAJ ABQJQ ACIWK AENEX AKJIK ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ EBS EJD HZ~ IFIPE IPLJI JAVBF M43 O9- OCL RIA RIE RIG RNS AAYXX CITATION 7SP 8FD L7M |
ID | FETCH-LOGICAL-c342t-1461de30e59c015a3815b54fbedb670f31c7975372c5dc638ab5d0e8291d58993 |
IEDL.DBID | RIE |
ISSN | 2168-6777 |
IngestDate | Thu Oct 10 15:17:15 EDT 2024 Fri Aug 23 03:49:47 EDT 2024 Mon Nov 04 12:07:28 EST 2024 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 4 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c342t-1461de30e59c015a3815b54fbedb670f31c7975372c5dc638ab5d0e8291d58993 |
ORCID | 0000-0002-2587-0024 0000-0003-3949-2172 0000-0002-3161-561X 0000-0002-1488-4762 |
OpenAccessLink | https://vbn.aau.dk/files/335970623/JESTPE_2019_12_1241.pdf |
PQID | 2556486060 |
PQPubID | 2040420 |
PageCount | 14 |
ParticipantIDs | crossref_primary_10_1109_JESTPE_2020_3008246 proquest_journals_2556486060 ieee_primary_9137650 |
PublicationCentury | 2000 |
PublicationDate | 2021-08-01 |
PublicationDateYYYYMMDD | 2021-08-01 |
PublicationDate_xml | – month: 08 year: 2021 text: 2021-08-01 day: 01 |
PublicationDecade | 2020 |
PublicationPlace | Piscataway |
PublicationPlace_xml | – name: Piscataway |
PublicationTitle | IEEE journal of emerging and selected topics in power electronics |
PublicationTitleAbbrev | JESTPE |
PublicationYear | 2021 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref11 ref10 (ref19) 2017 ref17 ref16 ref18 (ref2) 2019 smith (ref42) 2017 ref50 ref46 ref45 ref48 ref47 ref41 ref44 (ref1) 2019 (ref28) 2015 ref49 ref8 ref9 (ref30) 2020 ref4 ref3 ref6 (ref37) 2019 ref40 ref35 ref34 ref31 ref33 (ref7) 2019 ref32 yuan (ref29) 2014 ref39 ref38 lenz (ref21) 2016 inzunza (ref5) 2015 ref24 ref26 ref25 (ref43) 2012 ref20 ref22 (ref23) 2019 bayerer (ref36) 2008 ref27 |
References_xml | – start-page: 1 year: 2014 ident: ref29 article-title: Analytical averaged loss model of a three-level T-type converter publication-title: Proc IET PEMD contributor: fullname: yuan – year: 2019 ident: ref1 publication-title: Renewables 2019 Global Status Report (GRS) – start-page: 1 year: 2016 ident: ref21 article-title: IGBT power module solution in three-level topologies for 1 MW 1500 VOC solar applications publication-title: Proc PCIM Asia contributor: fullname: lenz – year: 2017 ident: ref42 publication-title: Reliability Maintainability and Risk Practical Methods for Engineers contributor: fullname: smith – ident: ref44 doi: 10.1109/TPEL.2016.2582344 – ident: ref50 doi: 10.1109/TPEL.2017.2665697 – ident: ref8 doi: 10.1109/TPEL.2015.2509643 – ident: ref46 doi: 10.1109/TPEL.2019.2962503 – ident: ref32 doi: 10.1109/PEAC.2014.7038066 – ident: ref48 doi: 10.1109/TPEL.2014.2325891 – year: 2019 ident: ref7 publication-title: Whitepaper 1500 V – ident: ref35 doi: 10.1049/cp.2014.0475 – ident: ref26 doi: 10.1109/TIA.2019.2947227 – ident: ref40 doi: 10.1109/TPEL.2017.2769161 – ident: ref6 doi: 10.1109/JESTPE.2015.2445735 – ident: ref47 doi: 10.1109/TPEL.2006.876867 – year: 2012 ident: ref43 publication-title: How to Measure Lifetime for Robustnesss Validation-Step by Step Rev 1 9 – ident: ref10 doi: 10.1109/TPEL.2014.2332754 – ident: ref17 doi: 10.1109/JESTPE.2016.2566259 – ident: ref34 doi: 10.1109/PEDS.1997.618742 – ident: ref4 doi: 10.1109/JESTPE.2019.2893106 – year: 2019 ident: ref2 publication-title: The World's Most Powerful 1500V String Inverter – year: 2017 ident: ref19 publication-title: Module Solutions for 1500 V Solar Inverters – ident: ref18 doi: 10.1109/CPERE45374.2019.8980134 – ident: ref24 doi: 10.1109/EPE.2015.7311717 – ident: ref33 doi: 10.1109/TPEL.2016.2573823 – start-page: 1 year: 2015 ident: ref5 article-title: Development of a 1500 Vdc photovoltaic inverter for utility-scale PV power plants publication-title: Proc IEEE 2nd Int Future Energy Electron Conf (IFEEC) contributor: fullname: inzunza – ident: ref9 doi: 10.1109/TIE.2016.2549503 – ident: ref12 doi: 10.1109/TPEL.2017.2678169 – ident: ref13 doi: 10.1109/JESTPE.2015.2428432 – start-page: 1 year: 2008 ident: ref36 article-title: Model for power cycling lifetime of IGBT modules-Various factors influencing lifetime publication-title: Proc CIPS contributor: fullname: bayerer – ident: ref25 doi: 10.1109/IECON.2017.8216208 – ident: ref3 doi: 10.24295/CPSSTPEA.2016.00009 – ident: ref11 doi: 10.1109/TIA.2018.2825955 – ident: ref20 doi: 10.1109/TIE.2012.2233698 – ident: ref14 doi: 10.24295/CPSSTPEA.2018.00009 – year: 2019 ident: ref23 publication-title: JKM360M-72-V – ident: ref16 doi: 10.1109/TPEL.2012.2198670 – ident: ref15 doi: 10.1109/TEC.2013.2252013 – ident: ref38 doi: 10.1115/1.4009458 – year: 2019 ident: ref37 publication-title: PC and TC Diagrams – ident: ref39 doi: 10.1109/TPEL.2012.2229472 – ident: ref27 doi: 10.1109/TEC.2018.2879217 – ident: ref41 doi: 10.1109/PEDG.2016.7527028 – year: 2015 ident: ref28 publication-title: Application Manual-Power Semiconductors – ident: ref49 doi: 10.1109/APEC.2010.5433438 – ident: ref31 doi: 10.1109/EPE.2013.6631986 – year: 2020 ident: ref30 publication-title: Gate Resistor-Principles and Applications – ident: ref45 doi: 10.1109/TPEL.2019.2893636 – ident: ref22 doi: 10.1109/MPEL.2018.2874509 |
SSID | ssj0000825978 |
Score | 2.4096007 |
Snippet | The installation cost of photovoltaic (PV) plants can be reduced considerably by extending the maximum dc voltage from 1000 to 1500 V (e.g., with more PV... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 4285 |
SubjectTerms | Electric potential Energy conversion efficiency Installation costs Inverters Lifetime mission profile multilevel inverters photovoltaic (PV) inverters Photovoltaic cells Power system reliability reliability Reliability analysis Reliability aspects Reliability engineering Service life assessment Stress Thermal cycling Topology Voltage |
Title | Lifetime Evaluation of Three-Level Inverters for 1500-V Photovoltaic Systems |
URI | https://ieeexplore.ieee.org/document/9137650 https://www.proquest.com/docview/2556486060 |
Volume | 9 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwELaACQZeBVFe8sCIWyexE3tEKKiqCkKiRWxR7JxFhdQgmi78enxJGiFgYMtgS9ad7_E5d98RciVCq2KlkbfVGSYcSKZBSZZrJBuLrFMCG5zvH-LRTIxf5MsGue56YQCgLj6DAX7W__KL0q7wqWyoA28OCNA3E62bXq3uPQWhjq4dbxjEisVJkrQkQwHXw3H6NH1MPRwMPUrFtZjwfgtE9WSVX-64jjF3e-R-fbqmtORtsKrMwH7-IG787_H3yW6bbNKb5nYckA1YHJKdbxSEPTKZzB3ggHmadrzftHR06nUMbIIlRRS5OLDyc0l9hkt9bsfZM318LavS-7Yqn1va8p4fkdldOr0dsXbCArORCCuGQ70LiDhIbX1ekPvwLY0UzkBh4oS7KLAJdt4moZWF9aaaG1lwUKEOCumRWnRMthblAk4I9cDLisA4j26NUHGuQBmei8hvky7m0CfXa3Fn7w2RRlYDEK6zRjsZaidrtdMnPRRgt7SVXZ-cr1WUtca2zJBFDWdpxfz0711nZDvEUpS6bu-cbFUfK7jwuURlLutL9AVjOcNW |
link.rule.ids | 315,783,787,799,27936,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1NT9wwEB2t6KFwoB-Aui1tfegRL05iO_axqhZtt1mExIK4RbEzVlGlTQXZC78eT5JdIcqhtxxsKZmxPe85M28AvsnUG20s6bYGx2VAxS0axStLYmOZD0ZSgfPiXM-u5PxG3YzgZFsLg4hd8hlO6LH7l183fk1XZac2iduBCPqriKuN7qu1tjcqRHZsd_SmiTZc53k-yAwlwp7Op5fLi2kkhGnkqTSWIO-TUNT1VvnnQO6izNkbWGzer08u-TNZt27iH55JN_7vB7yF_QFusu_9-ngHI1y9h70nIoQHUBS3AanFPJtulb9ZE9gyehl5QUlFjNQ4KPfznkWMyyK6E_yaXfxu2iaebm1169mgfH4IV2fT5Y8ZH3oscJ_JtOXU1rvGTKCyPiKDKgZw5ZQMDmuncxGyxOdUe5unXtU-btbKqVqgSW1Sq8jVsiPYWTUr_AAsUi8vExciv3XS6MqgcaKSWZymghY4hpONucu_vZRG2VEQYcveOyV5pxy8M4YDMuB26GC7MRxvXFQO2-2-JB016qalxceXZ32F17PloiiLn-e_PsFuSokpXRbfMey0d2v8HJFF6750C-oRyOPGoQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Lifetime+Evaluation+of+Three-Level+Inverters+for+1500-V+Photovoltaic+Systems&rft.jtitle=IEEE+journal+of+emerging+and+selected+topics+in+power+electronics&rft.au=He%2C+Jinkui&rft.au=Sangwongwanich%2C+Ariya&rft.au=Yang%2C+Yongheng&rft.au=Iannuzzo%2C+Francesco&rft.date=2021-08-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=2168-6777&rft.eissn=2168-6785&rft.volume=9&rft.issue=4&rft.spage=4285&rft_id=info:doi/10.1109%2FJESTPE.2020.3008246&rft.externalDBID=NO_FULL_TEXT |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=2168-6777&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=2168-6777&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=2168-6777&client=summon |