王振兴, 刘. 陈. 谭. 杨. 张. (2011). Understanding the failure mechanisms of microwave bipolar transistors caused by electrostatic discharge. Journal of semiconductors, 32(10), 44-48. https://doi.org/10.1088/1674-4926/32/10/104003
Chicago Style (17th ed.) Citation王振兴, 刘进 陈永光 谭志良 杨洁 张希军. "Understanding the Failure Mechanisms of Microwave Bipolar Transistors Caused by Electrostatic Discharge." Journal of Semiconductors 32, no. 10 (2011): 44-48. https://doi.org/10.1088/1674-4926/32/10/104003.
MLA (9th ed.) Citation王振兴, 刘进 陈永光 谭志良 杨洁 张希军. "Understanding the Failure Mechanisms of Microwave Bipolar Transistors Caused by Electrostatic Discharge." Journal of Semiconductors, vol. 32, no. 10, 2011, pp. 44-48, https://doi.org/10.1088/1674-4926/32/10/104003.
Warning: These citations may not always be 100% accurate.