Focusing of intense pulsed ion beam by magnetically insulated diode for material research

• Published in: Surface & coatings technology Vol. 384; p. 125351
• Main Authors: Yu, Xiao, Zhang, Shijian, Stepanov, Andrey Vladimirovich, Shamanin, Vitaly Igorevich, Zhong, Haowen, Liang, Guoying, Xu, Mofei, Zhang, Nan, Kuang, Shicheng, Ren, Jianhui, Shang, Xuying, Yan, Sha, Remnev, Gennady Efimovich, Le, Xiaoyun
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 25.02.2020; Elsevier BV
• Subjects: Ablation; Beam focusing; Comparative studies; Cross-sections; Flux density; Focusing; Infrared imaging; Infrared imaging diagnostics; Intense pulsed ion beam; Ion beams; Ion sources; Magnetic properties; Magnetically insulated diode; Material modification; Optimization; Proton beams; Surface flashover; Surface treatment; Temperature effects; Beam focusing; Infrared imaging diagnostics; Material modification; Intense pulsed ion beam; Magnetically insulated diode

The cross-sectional distribution and focusing properties of intense pulsed ion beam by an active magnetically insulated diode for material modification is presented. The ion beam accelerator BIPPAB-450 uses the surface flashover of polymers as the ion source, generates intense pulsed ion beam compos...