Chang, F., Lu, Y., & Pavlidis, T. (1999). Feature analysis using line sweep thinning algorithm. IEEE transactions on pattern analysis and machine intelligence, 21(2), 145-158. https://doi.org/10.1109/34.748823
Chicago Style (17th ed.) CitationChang, Fu, Ya-Ching Lu, and T. Pavlidis. "Feature Analysis Using Line Sweep Thinning Algorithm." IEEE Transactions on Pattern Analysis and Machine Intelligence 21, no. 2 (1999): 145-158. https://doi.org/10.1109/34.748823.
MLA (9th ed.) CitationChang, Fu, et al. "Feature Analysis Using Line Sweep Thinning Algorithm." IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 21, no. 2, 1999, pp. 145-158, https://doi.org/10.1109/34.748823.
Warning: These citations may not always be 100% accurate.