Creep deformation of a sixth generation Ni-base single crystal superalloy at 800°C

The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking...

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Published inMaterials Science and Engineering: A Vol. 608; pp. 95 - 100
Main Authors Yuan, Y., Kawagishi, K., Koizumi, Y., Kobayashi, T., Yokokawa, T., Harada, H.
Format Journal Article
LanguageEnglish
Japanese
Published Kidlington Elsevier B.V 01.07.2014
Elsevier BV
Elsevier
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Online AccessGet full text
ISSN0921-5093
1873-4936
DOI10.1016/j.msea.2014.04.069

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Abstract The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238.
AbstractList The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238.
Author Yuan, Y.
Yokokawa, T.
Kobayashi, T.
Kawagishi, K.
Koizumi, Y.
Harada, H.
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Keywords Creep mechanism
Stacking fault energy
Sixth generation
Ni-base superalloy
Single crystal
Shear
Creep
Creep test
Stacking fault
Precipitate
Superalloy
Rhenium addition
Microstructure
Creep deformation
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Japanese
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  ident: 10.1016/j.msea.2014.04.069_bib12
  publication-title: Acta Mater.
  doi: 10.1016/j.actamat.2010.03.041
– volume: 40
  start-page: 1
  year: 1992
  ident: 10.1016/j.msea.2014.04.069_bib19
  publication-title: Acta Metall. Mater.
  doi: 10.1016/0956-7151(92)90195-K
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Snippet The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and...
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SubjectTerms Applied sciences
Condensed matter: structure, mechanical and thermal properties
Creep
Creep mechanism
Cross-disciplinary physics: materials science; rheology
Defects and impurities in crystals; microstructure
Deformation, plasticity, and creep
Exact sciences and technology
Materials science
Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology
Metals. Metallurgy
Ni-base superalloy
Physics
Single crystal
Sixth generation
Stacking fault energy
Stacking faults and other planar or extended defects
Structure of solids and liquids; crystallography
Treatment of materials and its effects on microstructure and properties
Title Creep deformation of a sixth generation Ni-base single crystal superalloy at 800°C
URI https://dx.doi.org/10.1016/j.msea.2014.04.069
https://cir.nii.ac.jp/crid/1870020693116011008
Volume 608
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