Creep deformation of a sixth generation Ni-base single crystal superalloy at 800°C
The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking...
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Published in | Materials Science and Engineering: A Vol. 608; pp. 95 - 100 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English Japanese |
Published |
Kidlington
Elsevier B.V
01.07.2014
Elsevier BV Elsevier |
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Online Access | Get full text |
ISSN | 0921-5093 1873-4936 |
DOI | 10.1016/j.msea.2014.04.069 |
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Abstract | The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238. |
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AbstractList | The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and 735MPa along [001]. TMS-238 had a creep time more than sixty times longer than MX-4/PWA 1497. Microstructural observations showed that stacking faults (SFs) sheared both the γ matrix and γ΄ precipitates in MX-4/PWA 1497, however, SFs sheared only the γ matrix in TMS-238. The factors that affect the creep deformation are discussed. The results imply that the stacking fault energy (SFE) of γ matrix in TMS-238 is lower than that in MX-4. Higher additions of Re and Ru are responsible for the lower SFE in TMS-238. |
Author | Yuan, Y. Yokokawa, T. Kobayashi, T. Kawagishi, K. Koizumi, Y. Harada, H. |
Author_xml | – sequence: 1 givenname: Y. surname: Yuan fullname: Yuan, Y. email: masyy@163.com organization: Environment and Energy Materials Division, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan – sequence: 2 givenname: K. surname: Kawagishi fullname: Kawagishi, K. organization: High Temperature Materials Unit, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan – sequence: 3 givenname: Y. surname: Koizumi fullname: Koizumi, Y. organization: Environment and Energy Materials Division, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan – sequence: 4 givenname: T. surname: Kobayashi fullname: Kobayashi, T. organization: Environment and Energy Materials Division, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan – sequence: 5 givenname: T. surname: Yokokawa fullname: Yokokawa, T. organization: Environment and Energy Materials Division, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan – sequence: 6 givenname: H. surname: Harada fullname: Harada, H. organization: Environment and Energy Materials Division, National Institute for Materials Science, Sengen 1-2-1, Tsukuba 305-0047, Japan |
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Keywords | Creep mechanism Stacking fault energy Sixth generation Ni-base superalloy Single crystal Shear Creep Creep test Stacking fault Precipitate Superalloy Rhenium addition Microstructure Creep deformation |
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Snippet | The interrupted creep tests (ε=0.1%) of a fourth and a sixth generation Ni-base single crystals, i.e. MX-4/PWA 1497 and TMS-238, were conducted at 800°C and... |
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SubjectTerms | Applied sciences Condensed matter: structure, mechanical and thermal properties Creep Creep mechanism Cross-disciplinary physics: materials science; rheology Defects and impurities in crystals; microstructure Deformation, plasticity, and creep Exact sciences and technology Materials science Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology Metals. Metallurgy Ni-base superalloy Physics Single crystal Sixth generation Stacking fault energy Stacking faults and other planar or extended defects Structure of solids and liquids; crystallography Treatment of materials and its effects on microstructure and properties |
Title | Creep deformation of a sixth generation Ni-base single crystal superalloy at 800°C |
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