Yig Films With Low Magnetic Damping Obtained By Solgel On Silicon (100)

• Published in: Materials letters Vol. 161; pp. 384 - 386
• Main Authors: Peña-Garcia, R., Delgado, A., Guerra, Y., Padrón- Hernández, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.12.2015
• Subjects: Damping; Diffraction; FMR linewidth; Magnetic damping; Orthorhombic phase; Reflection; Scanning electron microscopy; Silicon substrates; Sol gel process; Sol–gel; Yttrium iron garnet; Yttrium iron garnet; FMR linewidth; Sol–gel; Magnetic damping
• ISSN: 0167-577X; 1873-4979
• DOI: 10.1016/j.matlet.2015.08.147

In this work we present the fabrication of yttrium iron garnet (YIG) films with low magnetic damping on silicon (100) substrate. We show in addition that the sol–gel method is a technique that allows the obtaining of YIG films with good quality. The study by X-ray diffraction (DRX) showed characteristic reflections of the cubic YIG phase as well as a very small reflection typical of the orthorhombic phase. The surface of the film was investigated by scanning electron microscopy (SEM) and showed the formation of very small regular pores. The ferromagnetic resonance measurement shows a good result with a low linewidth value of 53Oe. Our result here is the lowest value found in the literature for YIG film on silicon substrate. Our result is very important for spintronic experiments because these films obtained by sol–gel are thicker than the same films fabricated by the sputtering and other method. •We fabricated YIG films with low magnetic damping on silicon substrate.•Our result for FMR is a low linewidth value of 53Oe.•Our linewidth value is the lowest for YIG film on silicon substrate by sol–gel.