APA (7th ed.) Citation

Chen, J., Wang, X., Cai, S., Xu, J., Chen, J., & Chen, H. (2022). A software defect prediction method with metric compensation based on feature selection and transfer learning. Frontiers of information technology & electronic engineering, 23(5), 715-731. https://doi.org/10.1631/FITEE.2100468

Chicago Style (17th ed.) Citation

Chen, Jinfu, Xiaoli Wang, Saihua Cai, Jiaping Xu, Jingyi Chen, and Haibo Chen. "A Software Defect Prediction Method with Metric Compensation Based on Feature Selection and Transfer Learning." Frontiers of Information Technology & Electronic Engineering 23, no. 5 (2022): 715-731. https://doi.org/10.1631/FITEE.2100468.

MLA (9th ed.) Citation

Chen, Jinfu, et al. "A Software Defect Prediction Method with Metric Compensation Based on Feature Selection and Transfer Learning." Frontiers of Information Technology & Electronic Engineering, vol. 23, no. 5, 2022, pp. 715-731, https://doi.org/10.1631/FITEE.2100468.