Simulation of reactivity transients in current MTRs

This work aims at simulation of reactivity induced transients in High Enriched Uranium (HEU) and Low Enriched Uranium (LEU) cores of a typical Material Test research Reactor (MTR) using PARET code. The transient problem was forced through specification of externally inserted reactivity as a function...

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Bibliographic Details
Published inAnnals of nuclear energy Vol. 25; no. 18; pp. 1465 - 1484
Main Authors Mirza, Anwar M., Khanam, Salma, Mirza, Nasir M.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.12.1998
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Summary:This work aims at simulation of reactivity induced transients in High Enriched Uranium (HEU) and Low Enriched Uranium (LEU) cores of a typical Material Test research Reactor (MTR) using PARET code. The transient problem was forced through specification of externally inserted reactivity as a function of time. Reactivity insertions are idealized by ramps and steps. Superdelayed-critical transients, superprompt-critical transients and quasistatic transients are selected for the analysis. Ramp and step reactivity functions were employed to simulate these perturbations. The effect of initial power on transient behavior has also been investigated. The low enriched uranium core is analyzed for transients without scram. The magnitudes of maximum reactivity insertions are chosen to be in the range of $0.05 to 2.0 for different reactivity insertion times. Transient simulation with scram reveals that response of both HEU and LEU-cores is similar for selected ‘ramps’ and ‘steps’. The difference is observed in the peak values of power and coolant, clad and fuel temperatures. Trip level is achieved earlier in case of LEU-core. The peak clad temperatures in both LEU and HEU-cores remain below the melting point of aluminum-clad for the selected reactivity insertions. Simulation show that the LEU-core is more sensitive to perturbations at low power as compared to the transients at full power. For reactivity transients at low power level, power rises sharply to a higher peak value. In transients at full power, the peak power barely exceeds the trip level. The power oscillations after the first peak are observed for transients without scram.
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ISSN:0306-4549
1873-2100
DOI:10.1016/S0306-4549(98)00020-6