Angle-resolved X-ray photoemission electron microscopy - Menteş, Tevfik Onur; Locatelli, Andrea (Journal of electron spectroscopy and related phenomena, 2012)
Keywords: ARPES; Darkfield; Diffraction; Electron microscopy; Electronic structure; Imaging; LEEM; Microprobe; Oxides; Photoemission; Synchrotrons; XPEEM; Microprobe; XPEEM; LEEM; ARPES; Darkfield