In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials

• Published in: Journal of electron spectroscopy and related phenomena Vol. 188; pp. 161 - 165
• Main Authors: Szlachetko, J., Sá, J., Safonova, O.V., Smolentsev, G., Szlachetko, M., van Bokhoven, J.A., Nachtegaal, M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2013
• Subjects: Dynamic tests; Dynamics; Electronic structure; Electronics; In situ; Monitoring; Quick RIXS; RIXS; Spectroscopy; Time-resolved; X-rays; XAS; XES; Quick RIXS; XAS; Time-resolved; RIXS; In situ; XES

► The development of in situ time-resolved RIXS spectroscopy is reported. ► Analysis of the white line intensity of Au2O3 shows broadening effects of the initial and final states. ► A possible intermediate in the temperature programmed reduction of Au2O3 is detected. Hard X-ray RIXS permits monitori...