In situ hard X-ray quick RIXS to probe dynamic changes in the electronic structure of functional materials

• Published in: Journal of electron spectroscopy and related phenomena Vol. 188; pp. 161 - 165
• Main Authors: Szlachetko, J., Sá, J., Safonova, O.V., Smolentsev, G., Szlachetko, M., van Bokhoven, J.A., Nachtegaal, M.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2013
• Subjects: Dynamic tests; Dynamics; Electronic structure; Electronics; In situ; Monitoring; Quick RIXS; RIXS; Spectroscopy; Time-resolved; X-rays; XAS; XES; Quick RIXS; XAS; Time-resolved; RIXS; In situ; XES
• ISSN: 0368-2048; 1873-2526
• DOI: 10.1016/j.elspec.2012.11.002

► The development of in situ time-resolved RIXS spectroscopy is reported. ► Analysis of the white line intensity of Au2O3 shows broadening effects of the initial and final states. ► A possible intermediate in the temperature programmed reduction of Au2O3 is detected. Hard X-ray RIXS permits monitoring the electronic state of materials under in situ conditions. Time resolved, or quick RIXS, allows following dynamic changes in the electronic structure, which enables the identification of short-lived reaction intermediates. Within, we report the development of in situ quick RIXS spectroscopy, using a wavelength dispersive spectrometer operated in the von Hamos geometry. The main operational characteristics and performance of this experimental setup are presented. Dynamic changes in electronic structure are reported for the first time with quick RIXS, demonstrated on the reduction of Au2O3. The quick RIXS methodology can be implemented at any spectroscopy hard X-ray beamline. Therefore we envisage this tool to be widely used in the study of materials dynamic electronic changes.