Nearly optimal truncated group sequential test on binomial proportions
In this article, we systematically study the optimal truncated group sequential test on binomial proportions. Through analysis of the cost structure, average test cost is introduced as a new optimality criterion. According to the new criterion, the optimal tests on different design parameters includ...
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| Published in | Communications in statistics. Simulation and computation Vol. 47; no. 8; pp. 2332 - 2342 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
Philadelphia
Taylor & Francis
14.09.2018
Taylor & Francis Ltd |
| Subjects | |
| Online Access | Get full text |
| ISSN | 0361-0918 1532-4141 |
| DOI | 10.1080/03610918.2017.1343837 |
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| Abstract | In this article, we systematically study the optimal truncated group sequential test on binomial proportions. Through analysis of the cost structure, average test cost is introduced as a new optimality criterion. According to the new criterion, the optimal tests on different design parameters including the boundaries, success discriminant value, stage sample vector, stage size, and the maximum sample size are defined. Since the computation time in finding optimal designs by exhaustive search is intolerably long, group sequential sample space sorting method and procedures are developed to find the near-optimal ones. In comparison with the international standard ISO2859-1, the truncated group sequential designs proposed in this article can reduce the average test costs around 20%. |
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| AbstractList | In this article, we systematically study the optimal truncated group sequential test on binomial proportions. Through analysis of the cost structure, average test cost is introduced as a new optimality criterion. According to the new criterion, the optimal tests on different design parameters including the boundaries, success discriminant value, stage sample vector, stage size, and the maximum sample size are defined. Since the computation time in finding optimal designs by exhaustive search is intolerably long, group sequential sample space sorting method and procedures are developed to find the near-optimal ones. In comparison with the international standard ISO2859-1, the truncated group sequential designs proposed in this article can reduce the average test costs around 20%. |
| Author | Hu, Sigui Wang, Honglei |
| Author_xml | – sequence: 1 givenname: Sigui surname: Hu fullname: Hu, Sigui email: husigui@163.com organization: School of Biology and Engineering, Guizhou Medical University – sequence: 2 givenname: Honglei surname: Wang fullname: Wang, Honglei organization: School of Management, Guizhou University |
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| Copyright | 2018 Taylor & Francis Group, LLC 2018 2018 Taylor & Francis Group, LLC |
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| References | Simon R. (cit0013); 10 Yu J. (cit0017); 25 Xu S. (cit0016); 25 Chang M. N. (cit0003); 43 Barber S. (cit0001); 89 Chambaz A. (cit0002); 41 Pu X. L. (cit0010); 2006 Hampson L. V. (cit0004); 75 Hu S. G. (cit0005); 29 Sarne D. (cit0011); 72 Therneau T. M. (cit0014); 46 MIL-STD-105E. (cit0009) Wald A. (cit0015); 19 ISO 2859-1. (cit0007) Silva I. R. (cit0012); 71 Li Y. (cit0008); 53 IEC 1123. (cit0006) |
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| SubjectTerms | Binomial distribution Cost analysis Cost structure of experiment Design parameters Group sequential test Optimal design Optimality criteria Optimization Sequential analysis |
| Title | Nearly optimal truncated group sequential test on binomial proportions |
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