Nonaqueous Halide-Free Flux Reactions with Tin-Based Solders

New halide-free fluxes are becoming more prevalent in electronic packaging; however, their efficacy and reactive behavior with conventional solders has not been well characterized. In this work, we examine nonaqueous halide-free flux reactions of tin (Sn)-based solder surfaces using electrochemical...

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Published inJournal of electronic materials Vol. 44; no. 4; pp. 1144 - 1150
Main Authors Qu, Guoying, Weinman, Craig J., Ghosh, Tanushree, Flake, John C.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.04.2015
Springer Nature B.V
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Abstract New halide-free fluxes are becoming more prevalent in electronic packaging; however, their efficacy and reactive behavior with conventional solders has not been well characterized. In this work, we examine nonaqueous halide-free flux reactions of tin (Sn)-based solder surfaces using electrochemical methods. Cyclic voltammetry was used to study reactions of Sn(II) and Sn(IV) species, x-ray photoelectron spectroscopy (XPS) was used to study surface chemistry, and chronopotentiometry was used to quantify equilibrium constants of Sn–carboxylic complexes. Reactions were investigated using carboxylic acid solutions such as adipic acid or maleic acid in polyethylene glycol. Carboxylic acid-based fluxes are practically inactive toward SnO 2 removal at room temperature (25°C); however, some species are capable of removing the oxides at temperatures as high as 180°C and at pH as low as 0.1. XPS results suggest the H + activity of the carboxylic acid is the key to removing SnO 2 on Sn-based solder surfaces. Equilibrium coefficients and potential-pH diagrams are given to elucidate the influence of pH on Sn surfaces.
AbstractList New halide-free fluxes are becoming more prevalent in electronic packaging; however, their efficacy and reactive behavior with conventional solders has not been well characterized. In this work, we examine nonaqueous halide-free flux reactions of tin (Sn)-based solder surfaces using electrochemical methods. Cyclic voltammetry was used to study reactions of Sn(II) and Sn(IV) species, x-ray photoelectron spectroscopy (XPS) was used to study surface chemistry, and chronopotentiometry was used to quantify equilibrium constants of Sn-carboxylic complexes. Reactions were investigated using carboxylic acid solutions such as adipic acid or maleic acid in polyethylene glycol. Carboxylic acid-based fluxes are practically inactive toward SnO2 removal at room temperature (25°C); however, some species are capable of removing the oxides at temperatures as high as 180°C and at pH as low as 0.1. XPS results suggest the H^sup +^ activity of the carboxylic acid is the key to removing SnO2 on Sn-based solder surfaces. Equilibrium coefficients and potential-pH diagrams are given to elucidate the influence of pH on Sn surfaces.
New halide-free fluxes are becoming more prevalent in electronic packaging; however, their efficacy and reactive behavior with conventional solders has not been well characterized. In this work, we examine nonaqueous halide-free flux reactions of tin (Sn)-based solder surfaces using electrochemical methods. Cyclic voltammetry was used to study reactions of Sn(II) and Sn(IV) species, x-ray photoelectron spectroscopy (XPS) was used to study surface chemistry, and chronopotentiometry was used to quantify equilibrium constants of Sn–carboxylic complexes. Reactions were investigated using carboxylic acid solutions such as adipic acid or maleic acid in polyethylene glycol. Carboxylic acid-based fluxes are practically inactive toward SnO 2 removal at room temperature (25°C); however, some species are capable of removing the oxides at temperatures as high as 180°C and at pH as low as 0.1. XPS results suggest the H + activity of the carboxylic acid is the key to removing SnO 2 on Sn-based solder surfaces. Equilibrium coefficients and potential-pH diagrams are given to elucidate the influence of pH on Sn surfaces.
Author Weinman, Craig J.
Flake, John C.
Ghosh, Tanushree
Qu, Guoying
Author_xml – sequence: 1
  givenname: Guoying
  surname: Qu
  fullname: Qu, Guoying
  organization: Cain Department of Chemical Engineering, Louisiana State University
– sequence: 2
  givenname: Craig J.
  surname: Weinman
  fullname: Weinman, Craig J.
  organization: Intel Corporation
– sequence: 3
  givenname: Tanushree
  surname: Ghosh
  fullname: Ghosh, Tanushree
  organization: Intel Corporation
– sequence: 4
  givenname: John C.
  surname: Flake
  fullname: Flake, John C.
  email: johnflake@lsu.edu
  organization: Cain Department of Chemical Engineering, Louisiana State University
BookMark eNp1kE1LwzAYx4NMcJt-AG8Fz9E8zUtT8KLDOWEo6ARvIU1S7ajNTFrUb29GPXjx9Fx-_5fnP0OTzncOoVMg50BIcREBhGCYAMdUUI7FAZoCZxSDFC8TNCVUAOY55UdoFuOWJBAkTNHlve_0x-D8ELOVbhvr8DI4ly3b4St7dNr0je9i9tn0b9mm6fC1js5mT761LsRjdFjrNrqT3ztHz8ubzWKF1w-3d4urNTaUyh7bVC13FeFCkzqvKlOC5poxU1jCrOYS8tpWpRPMFkzr0vG8lLImiTNgqaFzdDb67oJPXWOvtn4IXYpUILikkhQUEgUjZYKPMbha7ULzrsO3AqL2I6lxJJV-V_uRlEiafNTExHavLvxx_lf0AxzbaqY
CODEN JECMA5
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ContentType Journal Article
Copyright The Minerals, Metals & Materials Society 2015
Copyright_xml – notice: The Minerals, Metals & Materials Society 2015
DBID AAYXX
CITATION
3V.
7XB
88I
8AF
8AO
8FE
8FG
8FK
8G5
ABJCF
ABUWG
AFKRA
ARAPS
AZQEC
BENPR
BGLVJ
CCPQU
D1I
DWQXO
GNUQQ
GUQSH
HCIFZ
KB.
L6V
M2O
M2P
M7S
MBDVC
P5Z
P62
PDBOC
PQEST
PQQKQ
PQUKI
PRINS
PTHSS
Q9U
S0X
DOI 10.1007/s11664-015-3635-6
DatabaseName CrossRef
ProQuest Central (Corporate)
ProQuest Central (purchase pre-March 2016)
Science Database (Alumni Edition)
STEM Database
ProQuest Pharma Collection
ProQuest SciTech Collection
ProQuest Technology Collection
ProQuest Central (Alumni) (purchase pre-March 2016)
Research Library (Alumni Edition)
Materials Science & Engineering Collection
ProQuest Central (Alumni Edition)
ProQuest Central
Advanced Technologies & Aerospace Database‎ (1962 - current)
ProQuest Central Essentials
ProQuest Central
Technology Collection
ProQuest One Community College
ProQuest Materials Science Collection
ProQuest Central Korea
ProQuest Central Student
Research Library Prep
SciTech Premium Collection
Materials Science Database
ProQuest Engineering Collection
Research Library
Science Database
Engineering Database
Research Library (Corporate)
Advanced Technologies & Aerospace Database
ProQuest Advanced Technologies & Aerospace Collection
Materials Science Collection
ProQuest One Academic Eastern Edition (DO NOT USE)
ProQuest One Academic
ProQuest One Academic UKI Edition
ProQuest Central China
Engineering Collection
ProQuest Central Basic
SIRS Editorial
DatabaseTitle CrossRef
Research Library Prep
ProQuest Central Student
Technology Collection
ProQuest Advanced Technologies & Aerospace Collection
ProQuest Central Essentials
SIRS Editorial
Materials Science Collection
ProQuest AP Science
ProQuest Central (Alumni Edition)
SciTech Premium Collection
ProQuest One Community College
Research Library (Alumni Edition)
ProQuest Pharma Collection
ProQuest Central China
ProQuest Central
ProQuest Engineering Collection
ProQuest Central Korea
Materials Science Database
ProQuest Research Library
Engineering Collection
ProQuest Materials Science Collection
Advanced Technologies & Aerospace Collection
Engineering Database
ProQuest Science Journals (Alumni Edition)
ProQuest Central Basic
ProQuest Science Journals
ProQuest One Academic Eastern Edition
ProQuest Technology Collection
ProQuest SciTech Collection
Advanced Technologies & Aerospace Database
ProQuest One Academic UKI Edition
Materials Science & Engineering Collection
ProQuest One Academic
ProQuest Central (Alumni)
DatabaseTitleList Research Library Prep

Database_xml – sequence: 1
  dbid: 8FG
  name: ProQuest Technology Collection
  url: https://search.proquest.com/technologycollection1
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1543-186X
EndPage 1150
ExternalDocumentID 3605312791
10_1007_s11664_015_3635_6
Genre Feature
GroupedDBID -4Y
-58
-5G
-BR
-EM
-Y2
-~C
-~X
.4S
.86
.DC
.VR
06C
06D
0R~
0VY
199
1N0
1SB
2.D
203
28-
29K
2J2
2JN
2JY
2KG
2KM
2LR
2VQ
2~H
30V
3V.
4.4
406
408
40D
40E
5GY
5VS
67Z
6NX
78A
88I
8AF
8AO
8FE
8FG
8FW
8G5
8TC
8UJ
95-
95.
95~
96X
AABHQ
AABYN
AAFGU
AAGCJ
AAHNG
AAIAL
AAIKT
AAJKR
AANZL
AARHV
AARTL
AATNV
AATVU
AAUCO
AAUYE
AAWCG
AAYFA
AAYIU
AAYQN
AAYTO
ABDZT
ABECU
ABEFU
ABFGW
ABFTD
ABFTV
ABHLI
ABHQN
ABJCF
ABJNI
ABJOX
ABKAS
ABKCH
ABMNI
ABMQK
ABNWP
ABQBU
ABSXP
ABTAH
ABTEG
ABTHY
ABTKH
ABTMW
ABULA
ABUWG
ABWNU
ABXPI
ACBEA
ACBMV
ACBRV
ACBXY
ACBYP
ACGFO
ACGFS
ACGOD
ACHSB
ACHXU
ACIGE
ACIHN
ACIPQ
ACIWK
ACKNC
ACMDZ
ACMLO
ACOKC
ACOMO
ACREN
ACTTH
ACVWB
ACWMK
ADHHG
ADHIR
ADINQ
ADKNI
ADKPE
ADMDM
ADOXG
ADRFC
ADTPH
ADURQ
ADYFF
ADYOE
ADZKW
AEAQA
AEBTG
AEEQQ
AEFTE
AEGAL
AEGNC
AEJHL
AEJRE
AEKMD
AENEX
AEOHA
AEPYU
AESKC
AESTI
AETLH
AEVLU
AEVTX
AEXYK
AFEXP
AFGCZ
AFKRA
AFLOW
AFNRJ
AFQWF
AFWTZ
AFYQB
AFZKB
AGAYW
AGDGC
AGGBP
AGGDS
AGJBK
AGMZJ
AGQMX
AGWIL
AGWZB
AGYKE
AHAVH
AHBYD
AHKAY
AHSBF
AHYZX
AIAKS
AIIXL
AILAN
AIMYW
AITGF
AJBLW
AJDOV
AJGSW
AJRNO
AJZVZ
AKQUC
ALMA_UNASSIGNED_HOLDINGS
ALWAN
AMKLP
AMTXH
AMXSW
AMYLF
AMYQR
AOCGG
ARAPS
ARCSS
ARMRJ
ASPBG
AVWKF
AXYYD
AYJHY
AZFZN
AZQEC
B-.
BA0
BBWZM
BDATZ
BENPR
BGLVJ
BGNMA
BPHCQ
C1A
CAG
CCPQU
COF
CS3
CSCUP
CZ9
D-I
D1I
DDRTE
DNIVK
DPUIP
DU5
DWQXO
E3Z
EBLON
EBS
EDO
EIOEI
EJD
ESBYG
FEDTE
FERAY
FFXSO
FIGPU
FINBP
FNLPD
FRRFC
FSGXE
FWDCC
G-Y
G-Z
G8K
GGCAI
GGRSB
GJIRD
GNUQQ
GNWQR
GQ6
GQ7
GUQSH
HCIFZ
HF~
HG5
HG6
HMJXF
HRMNR
HVGLF
HZ~
I-F
IJ-
IKXTQ
ITM
IWAJR
IXC
IXE
IZQ
I~X
I~Z
J-C
J0Z
JBSCW
JZLTJ
KB.
KC.
KDC
KOV
L6V
LLZTM
M2O
M2P
M2Q
M4Y
M7S
MA-
MK~
N2Q
N9A
NB0
NDZJH
NF0
NPVJJ
NQJWS
NU0
O9-
O93
O9G
O9I
O9J
OAM
P19
P2P
P62
P9N
PDBOC
PF0
PK8
PQQKQ
PROAC
PT4
PT5
PTHSS
Q2X
QF4
QM1
QN7
QO4
QOK
QOR
QOS
R4E
R89
R9I
RHV
RNI
RNS
ROL
RPX
RSV
RWL
RXW
RZK
S0X
S16
S1Z
S26
S27
S28
S3B
SAP
SCG
SCLPG
SCM
SDH
SDM
SHX
SISQX
SNE
SNPRN
SNX
SOHCF
SOJ
SPISZ
SQXTU
SRMVM
SSLCW
STPWE
SZN
T13
T16
TAE
TSG
TSK
TSV
TUC
TUS
TWZ
U2A
UG4
UNUBA
UOJIU
UTJUX
UZXMN
VC2
VFIZW
W48
W4F
WK8
XFK
YLTOR
Z45
Z5O
Z7R
Z7S
Z7V
Z7W
Z7X
Z7Y
Z7Z
Z83
Z85
Z88
Z8M
Z8N
Z8P
Z8Q
Z8R
Z8T
Z8W
Z8Z
Z92
ZE2
ZMTXR
ZY4
~EX
AACDK
AAEOY
AAJBT
AASML
AAYXX
ABAKF
ACAOD
ACDTI
ACZOJ
AEFQL
AEMSY
AFBBN
AGJZZ
AGQEE
AGRTI
AIGIU
CITATION
H13
SJYHP
7XB
8FK
MBDVC
PQEST
PQUKI
PRINS
Q9U
ID FETCH-LOGICAL-c338t-d1662eb056a0f2bbc91a5a44c7d04da5812fdb9e64d74aa9e52988f0c91c1d3c3
IEDL.DBID 8FG
ISSN 0361-5235
IngestDate Fri Sep 13 05:47:40 EDT 2024
Thu Sep 12 17:39:35 EDT 2024
Sat Dec 16 12:02:17 EST 2023
IsPeerReviewed true
IsScholarly true
Issue 4
Keywords Tin
pH
flux
equilibrium
carboxylic
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c338t-d1662eb056a0f2bbc91a5a44c7d04da5812fdb9e64d74aa9e52988f0c91c1d3c3
PQID 1658380731
PQPubID 48394
PageCount 7
ParticipantIDs proquest_journals_1658380731
crossref_primary_10_1007_s11664_015_3635_6
springer_journals_10_1007_s11664_015_3635_6
PublicationCentury 2000
PublicationDate 2015-04-01
PublicationDateYYYYMMDD 2015-04-01
PublicationDate_xml – month: 04
  year: 2015
  text: 2015-04-01
  day: 01
PublicationDecade 2010
PublicationPlace Boston
PublicationPlace_xml – name: Boston
– name: Warrendale
PublicationTitle Journal of electronic materials
PublicationTitleAbbrev Journal of Elec Materi
PublicationYear 2015
Publisher Springer US
Springer Nature B.V
Publisher_xml – name: Springer US
– name: Springer Nature B.V
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SSID ssj0015181
Score 2.1188474
Snippet New halide-free fluxes are becoming more prevalent in electronic packaging; however, their efficacy and reactive behavior with conventional solders has not...
SourceID proquest
crossref
springer
SourceType Aggregation Database
Publisher
StartPage 1144
SubjectTerms Aqueous solutions
Characterization and Evaluation of Materials
Chemical reactions
Chemistry and Materials Science
Electronics and Microelectronics
Equilibrium
Instrumentation
Materials Science
Optical and Electronic Materials
Soldering
Solid State Physics
SummonAdditionalLinks – databaseName: SpringerLink Journals (ICM)
  dbid: U2A
  link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEB5qvehBfGK1Sg6elEiTTdJd8FLFpQj2oC30FpJNFkTZlj7An-9k222r6MHzZkOYJPN9k3kBXAnlM8FD6UvEXipCHI1BWKLWRsKo2EeMhXzn557qDsTTUA5rwFdPF8X7beWRLBX1OteNKRUCJiSNECSp2oLtwB3CSR7wzspzIFnZmBQVMwtGlqw8mb9N8R2L1gTzh0-0hJp0H_aWHJF0Fpt6ADVfHMLuRuXAI7jrIYPGedBuJ12k0s7TdOI9ST_mn-TFL7IVpiS8spL-W0HvEawceR2FntzTYxikj_2HLl02QqAZWpAz6nDd3FvkKqaVc2uzhBlphMjariWckQjSubOJV8K1hTGJlzyJ47yF4zLmoiw6gXoxKvwpEBVzH2d4cTn-b2I0gEN5nRxJok0ivIwNuK5EoseLehd6Xdk4yE-j_HSQn1YNaFZC08ujP9VMBU8sag7WgJtKkBuf_5rs7F-jz2GHh40sY2iaUJ9N5v4C6cHMXpbn4Qslda48
  priority: 102
  providerName: Springer Nature
Title Nonaqueous Halide-Free Flux Reactions with Tin-Based Solders
URI https://link.springer.com/article/10.1007/s11664-015-3635-6
https://www.proquest.com/docview/1658380731/abstract/
Volume 44
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qe9GD-MRqLTl4UpZ2k82agCCtNC2KRaoFPYV9FQRJtQ_w5zuTNrYKetrDZpcw-_i-2XkBnAnpjPAp9SViLxPkR6MQlpjWgVAycgHnFO9835e9obh9Dp9L0CtiYcitsrgT84vajg29kTe4JAMfbkjeUJpeAcyscf3-wah-FNlZl8U0NqDCKScexYwn3W97QsjzcqV4XXNSvcLCvpkH0XEpyRMjZAGiL5M_EWpFO39ZSnMASnZge8kcvdZiqXeh5LI92FrLJ7gPV33k1TgPavNeDwm2dSyZOOclb_NPb-AWMQxTj95evafXjLURwqz3OKZK3dMDGCadp5seW5ZHYAb1yhmz-N--08hgVHPka21irkIlhLm0TWFViNA9sjp2UthLoVTsQj-OolETvzPcBiY4hHI2ztwReDLyXWTwOPs4XkWoFlPSnRFSRx0HeESrcF6IJH1fZMFIV_mOSX4pyi8l-aWyCrVCaOnyQEzT1fJV4aIQ5Fr3X5Md_z_ZCWz6tHK5K00NyrPJ3J0iS5jper4B6lBpJe12n9ruy10H23an_zDA3qHf-gKNFLtp
link.rule.ids 315,786,790,12792,21416,27957,27958,33408,33779,41116,41558,42185,42627,43635,43840,52146,52269,74392,74659
linkProvider ProQuest
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3NS8MwFA86D-pB_MTp1Bw8KcGlTbMWBFGxVt120A28hTRJQZBtrhv45_te17op6LnNI7x8_H4v74uQUyGdER6WvgTsZQLjaDTAEktTX2gZOp9zzHfudGXSF4-vwWv54JaXYZXVnVhc1HZo8I38gkt08MGG5FejD4Zdo9C7WrbQWCYrwgfoxEzx-P7bixDwokkpXNIcDa6g8moWqXNcSoy_CBgOZPInLs3J5i__aAE78SbZKPkivZ4t8BZZcoNtsr5QRXCHXHaBTYMcsOFpArTaOhaPnaPx-_STPrtZ5kJO8cWV9t4G7AaAy9KXIfbnzndJP77r3SasbIrADFiTE2Zh3p5LgbfoZualqYm4DrQQpmWbwuoAADuzaeSksC2hdeQCLwrDrAn_GW594--R2mA4cPuEytBzoYFD7MF4HYIxjKV2MiCMaeTDwayTs0olajSrfaHmVY5Rfwr0p1B_StZJo1KaKo9BruaLVifnlSIXPv8l7OB_YSdkNel12qr90H06JGsermIRTNMgtcl46o6AJ0zS42IzfAFOIbUE
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwEA-6geiD-InTqXnwSQlb2iRrQRCnK_OrjLnB3kqapCBIN9cN_PO9dK2bgj63Pcrlcr_f5S53CF0wYRRzbOtLwF7CbB2NBFgicewyKTzjUmrvO7-EojtkjyM-KuqfsqKssvSJuaPWY2XPyBtU2AQfGCRtJEVZRO8-uJl8EDtBymZai3Ea66jaYoKDhVfbnbDX_84pcJqPLAWXTW34xcscZ36RjgphqzE4cQGBifiJUkvq-StbmoNQsIO2C_aIbxfLvYvWTLqHtlZ6Cu6j6xC4NciBiB53gWRrQ4KpMTh4n3_ivlncY8iwPX_Fg7eUtAHGNH4d22nd2QEaBp3BXZcUIxKIgthyRjT8t2NiYDGymThxrHwquWRMtXSTackBvhMd-0Yw3WJS-oY7vuclTXhPUe0q9xBV0nFqjhAWnmM8BVvage-lB6GxbbyTAH2MfRe2aQ1dliqJJotOGNGy57HVXwT6i6z-IlFD9VJpUbEpsmi5hDV0VSpy5fFfwo7_F3aONsASoueH8OkEbTp2EfPKmjqqzKZzcwqkYRafFdbwBSfsuqc
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Nonaqueous+Halide-Free+Flux+Reactions+with+Tin-Based+Solders&rft.jtitle=Journal+of+electronic+materials&rft.au=Qu%2C+Guoying&rft.au=Weinman%2C+Craig+J.&rft.au=Ghosh%2C+Tanushree&rft.au=Flake%2C+John+C.&rft.date=2015-04-01&rft.issn=0361-5235&rft.eissn=1543-186X&rft.volume=44&rft.issue=4&rft.spage=1144&rft.epage=1150&rft_id=info:doi/10.1007%2Fs11664-015-3635-6&rft.externalDBID=n%2Fa&rft.externalDocID=10_1007_s11664_015_3635_6
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0361-5235&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0361-5235&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0361-5235&client=summon