A heuristic approach for near optimal truncated sequential test of exponential distribution

• Published in: Sequential analysis Vol. 37; no. 4; pp. 431 - 454
• Main Authors: Hu, Sigui, Wang, Honglei
• Format: Journal Article
• Language: English
• Published: Philadelphia Taylor & Francis 02.10.2018; Taylor & Francis Ltd
• Subjects: Computational statistics; Heuristic methods; optimal design; Probability distribution functions; quality control; sequential test; Testing time

Optimal truncated sequential test of the exponential distribution is studied in this paper. Definitions and relative concepts of optimal truncated sequential test are discussed. A heuristic approach, sample space sorting method (SSSM) and the procedures are established to solve a near optimal trunca...