The influence of mechanical deformation on the electrical properties of single wall carbon nanotubes - Liu, B.; Jiang, H.; Johnson, H.T.; Huang, Y. (Journal of the mechanics and physics of solids, 2004)
Keywords: Carbon nanotube; Continuum analysis; Electromechanical processes; Semiconductor material; Tight-binding; Carbon nanotube; Electromechanical processes; Continuum analysis; Semiconductor material; Tight-binding