Gamma-Ray Induced Radiation Damage Up to 340 Mrad in Various Scintillation Crystals
Because of their superb energy resolution and detection efficiency scintillation crystals are widely used in high energy and nuclear physics experiments. A crucial issue is radiation damage in crystals. We report an investigation on γ-ray induced radiation damage in various crystal scintillators of...
Saved in:
Published in | IEEE transactions on nuclear science Vol. 63; no. 2; pp. 612 - 619 |
---|---|
Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.04.2016
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Because of their superb energy resolution and detection efficiency scintillation crystals are widely used in high energy and nuclear physics experiments. A crucial issue is radiation damage in crystals. We report an investigation on γ-ray induced radiation damage in various crystal scintillators of large size, including BaF 2 , BGO, CeF 3 , pure CsI, LSO/LYSO/LFS and PWO, with an integrated dose up to 340 Mrad and a dose rate up to 1 Mrad/h. Optical and scintillation properties of these crystal samples were measured before and after irradiations. The results show that pure CsI has good radiation hardness below 100 krad. BaF 2 , BGO and LYSO have good radiation hardness beyond 1 Mrad. In terms of light output degradation LYSO is clearly the best among all scintillation crystals. |
---|---|
AbstractList | Because of their superb energy resolution and detection efficiency scintillation crystals are widely used in high energy and nuclear physics experiments. A crucial issue is radiation damage in crystals. We report an investigation on γ-ray induced radiation damage in various crystal scintillators of large size, including BaF 2 , BGO, CeF 3 , pure CsI, LSO/LYSO/LFS and PWO, with an integrated dose up to 340 Mrad and a dose rate up to 1 Mrad/h. Optical and scintillation properties of these crystal samples were measured before and after irradiations. The results show that pure CsI has good radiation hardness below 100 krad. BaF 2 , BGO and LYSO have good radiation hardness beyond 1 Mrad. In terms of light output degradation LYSO is clearly the best among all scintillation crystals. Because of their superb energy resolution and detection efficiency scintillation crystals are widely used in high energy and nuclear physics experiments. A crucial issue is radiation damage in crystals. We report an investigation on [Formula Omitted]-ray induced radiation damage in various crystal scintillators of large size, including [Formula Omitted], BGO, [Formula Omitted], pure CsI, LSO/LYSO/LFS and PWO, with an integrated dose up to 340 Mrad and a dose rate up to 1 Mrad/h. Optical and scintillation properties of these crystal samples were measured before and after irradiations. The results show that pure CsI has good radiation hardness below 100 krad. [Formula Omitted], BGO and LYSO have good radiation hardness beyond 1 Mrad. In terms of light output degradation LYSO is clearly the best among all scintillation crystals. |
Author | Liyuan Zhang Fan Yang Ren-Yuan Zhu |
Author_xml | – sequence: 1 givenname: Fan surname: Yang fullname: Yang, Fan – sequence: 2 givenname: Liyuan surname: Zhang fullname: Zhang, Liyuan – sequence: 3 givenname: Ren-Yuan surname: Zhu fullname: Zhu, Ren-Yuan |
BookMark | eNo9kMtKw0AUhgepYFvdC24GXKfONZNZStVaqAq9uB1OMxOZ0iR1Jln0bXwWn8zUiKufw_n-c-AboUFVVw6ha0omlBJ9t35dTRihcsIkkYrRMzSkUmYJlSoboCEhNEu00PoCjWLcdaPouCFaz6AsIVnCEc8r2-bO4iVYD42vK_wAJXw4vDngpsZckO-vlwAW-wq_Q_B1G_Eq91Xj9_uen4ZjbGAfL9F50YW7-ssx2jw9rqfPyeJtNp_eL5Kc86xJONMCtkxDmm4zSYFo0Mxa4ZQGKwrrOKVOk1R0e0EUs1tXALdU5dpanjI-Rrf93UOoP1sXG7Or21B1Lw1VmaJSZL8U6ak81DEGV5hD8CWEo6HEnNyZzp05uTN_7rrKTV_xzrl_XAmmldb8BzA-a8M |
CODEN | IETNAE |
CitedBy_id | crossref_primary_10_1021_acs_cgd_2c01504 crossref_primary_10_1109_TNS_2018_2840160 crossref_primary_10_1016_j_nima_2019_162767 crossref_primary_10_1016_j_nima_2019_04_044 crossref_primary_10_3390_instruments6040057 crossref_primary_10_1109_TNS_2022_3149840 crossref_primary_10_1063_5_0047026 crossref_primary_10_1109_TNS_2018_2868678 crossref_primary_10_1109_TNS_2021_3075943 crossref_primary_10_1088_1748_0221_15_09_C09002 crossref_primary_10_3390_cryst11060669 crossref_primary_10_1016_j_nima_2023_168749 crossref_primary_10_1088_1748_0221_17_08_P08028 crossref_primary_10_1364_PRJ_412959 crossref_primary_10_1088_1742_6596_928_1_012029 crossref_primary_10_1109_TNS_2019_2918305 crossref_primary_10_1021_acsami_0c13236 crossref_primary_10_1016_j_nima_2021_165043 crossref_primary_10_3390_instruments6040067 crossref_primary_10_1109_TNS_2016_2633427 crossref_primary_10_1016_j_radmeas_2023_106912 crossref_primary_10_1109_TNS_2020_3009251 crossref_primary_10_1109_TNS_2018_2808841 crossref_primary_10_1016_j_mtphys_2021_100390 crossref_primary_10_1088_1742_6596_1162_1_012020 crossref_primary_10_1088_1742_6596_1162_1_012022 crossref_primary_10_1088_1748_0221_12_07_C07042 crossref_primary_10_1088_1748_0221_17_02_P02034 crossref_primary_10_1109_TNS_2020_2989116 crossref_primary_10_1039_D0NR00772B |
Cites_doi | 10.1109/TNS.2013.2279993 10.1016/0168-9002(84)90203-1 10.1016/0168-9002(94)90125-2 10.1088/1742-6596/587/1/012001 10.1016/0168-9002(93)91185-P 10.1016/0168-9002(85)90988-X 10.1109/TNS.2004.832561 10.1088/1742-6596/587/1/012014 10.1016/0168-9002(93)90852-9 10.1109/TNS.2007.902370 10.1109/TNS.2007.897823 10.1088/1742-6596/404/1/012025 10.1109/TNS.2004.832804 10.1016/0167-5087(83)91247-4 10.1016/S0168-9002(98)00498-7 10.1109/TNS.2007.891673 10.1016/j.physletb.2012.08.021 |
ContentType | Journal Article |
Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 |
Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016 |
DBID | 97E RIA RIE AAYXX CITATION 7QF 7QL 7QQ 7SC 7SE 7SP 7SR 7T7 7TA 7TB 7U5 7U9 8BQ 8FD C1K F28 FR3 H8D H94 JG9 JQ2 KR7 L7M L~C L~D M7N P64 |
DOI | 10.1109/TNS.2015.2505721 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE/IET Electronic Library (IEL) CrossRef Aluminium Industry Abstracts Bacteriology Abstracts (Microbiology B) Ceramic Abstracts Computer and Information Systems Abstracts Corrosion Abstracts Electronics & Communications Abstracts Engineered Materials Abstracts Industrial and Applied Microbiology Abstracts (Microbiology A) Materials Business File Mechanical & Transportation Engineering Abstracts Solid State and Superconductivity Abstracts Virology and AIDS Abstracts METADEX Technology Research Database Environmental Sciences and Pollution Management ANTE: Abstracts in New Technology & Engineering Engineering Research Database Aerospace Database AIDS and Cancer Research Abstracts Materials Research Database ProQuest Computer Science Collection Civil Engineering Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Algology Mycology and Protozoology Abstracts (Microbiology C) Biotechnology and BioEngineering Abstracts |
DatabaseTitle | CrossRef Materials Research Database Technology Research Database Computer and Information Systems Abstracts – Academic Mechanical & Transportation Engineering Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Materials Business File Environmental Sciences and Pollution Management Aerospace Database Engineered Materials Abstracts Bacteriology Abstracts (Microbiology B) Algology Mycology and Protozoology Abstracts (Microbiology C) AIDS and Cancer Research Abstracts Industrial and Applied Microbiology Abstracts (Microbiology A) Advanced Technologies Database with Aerospace ANTE: Abstracts in New Technology & Engineering Civil Engineering Abstracts Aluminium Industry Abstracts Virology and AIDS Abstracts Electronics & Communications Abstracts Ceramic Abstracts METADEX Biotechnology and BioEngineering Abstracts Computer and Information Systems Abstracts Professional Solid State and Superconductivity Abstracts Engineering Research Database Corrosion Abstracts |
DatabaseTitleList | Materials Research Database |
Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1558-1578 |
EndPage | 619 |
ExternalDocumentID | 4047025151 10_1109_TNS_2015_2505721 7429799 |
Genre | orig-research |
GroupedDBID | .DC .GJ 0R~ 29I 3O- 4.4 53G 5GY 5RE 5VS 6IK 8WZ 97E A6W AAJGR AASAJ ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT ACPRK AENEX AETEA AETIX AFRAH AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RIG RNS TAE TN5 VH1 VOH XFK ZA5 AAYXX CITATION 7QF 7QL 7QQ 7SC 7SE 7SP 7SR 7T7 7TA 7TB 7U5 7U9 8BQ 8FD C1K F28 FR3 H8D H94 JG9 JQ2 KR7 L7M L~C L~D M7N P64 |
ID | FETCH-LOGICAL-c338t-3294ab29a66b851a09a92dd4e79ad4fde311e906466b4072dbefa3d17c9dd3623 |
IEDL.DBID | RIE |
ISSN | 0018-9499 |
IngestDate | Thu Oct 10 19:29:22 EDT 2024 Thu Sep 26 17:48:32 EDT 2024 Wed Jun 26 19:22:15 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 2 |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c338t-3294ab29a66b851a09a92dd4e79ad4fde311e906466b4072dbefa3d17c9dd3623 |
PQID | 1787154862 |
PQPubID | 85457 |
PageCount | 8 |
ParticipantIDs | ieee_primary_7429799 crossref_primary_10_1109_TNS_2015_2505721 proquest_journals_1787154862 |
PublicationCentury | 2000 |
PublicationDate | 2016-April 2016-4-00 20160401 |
PublicationDateYYYYMMDD | 2016-04-01 |
PublicationDate_xml | – month: 04 year: 2016 text: 2016-April |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York |
PublicationTitle | IEEE transactions on nuclear science |
PublicationTitleAbbrev | TNS |
PublicationYear | 2016 |
Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
References | ref13 ref12 ref15 ref14 ref11 ref10 ref1 ref17 ref16 ref8 ref7 ref9 ref4 zhu (ref2) 2004; 51 ref3 ref6 ref5 |
References_xml | – ident: ref5 doi: 10.1109/TNS.2013.2279993 – ident: ref15 doi: 10.1016/0168-9002(84)90203-1 – ident: ref12 doi: 10.1016/0168-9002(94)90125-2 – ident: ref3 doi: 10.1088/1742-6596/587/1/012001 – ident: ref10 doi: 10.1016/0168-9002(93)91185-P – ident: ref14 doi: 10.1016/0168-9002(85)90988-X – ident: ref11 doi: 10.1109/TNS.2004.832561 – ident: ref4 doi: 10.1088/1742-6596/587/1/012014 – ident: ref13 doi: 10.1016/0168-9002(93)90852-9 – ident: ref6 doi: 10.1109/TNS.2007.902370 – ident: ref7 doi: 10.1109/TNS.2007.897823 – ident: ref17 doi: 10.1088/1742-6596/404/1/012025 – volume: 51 start-page: 1560 year: 2004 ident: ref2 article-title: Precision lead tungstate crystal calorimeter for CMS at LHC publication-title: IEEE Trans Nucl Sci doi: 10.1109/TNS.2004.832804 contributor: fullname: zhu – ident: ref16 doi: 10.1016/0167-5087(83)91247-4 – ident: ref8 doi: 10.1016/S0168-9002(98)00498-7 – ident: ref9 doi: 10.1109/TNS.2007.891673 – ident: ref1 doi: 10.1016/j.physletb.2012.08.021 |
SSID | ssj0014505 |
Score | 2.3966355 |
Snippet | Because of their superb energy resolution and detection efficiency scintillation crystals are widely used in high energy and nuclear physics experiments. A... |
SourceID | proquest crossref ieee |
SourceType | Aggregation Database Publisher |
StartPage | 612 |
SubjectTerms | Absorption Crystals Emission Gamma-rays light output longitudinal transmittance Optical variables measurement radiation damage Radiation effects scintillation crystal Systematics Uncertainty |
Title | Gamma-Ray Induced Radiation Damage Up to 340 Mrad in Various Scintillation Crystals |
URI | https://ieeexplore.ieee.org/document/7429799 https://www.proquest.com/docview/1787154862 |
Volume | 63 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV07T8MwED6VTjDwKohCQR5YkEiah5PUIyqUCqkdSou6RXbsSAiaVG06lF_Db-GXcc6j4jWwRYodWXf23Xe583cAl0FHeS6NqeHFnmNQTwhD85oZ1O_EjrAjlwb6ovBg6Pcn9GHqTWtwvbkLo5TKi8-UqR_zXL5Mo5X-VdbGME5nobZgq2M5xV2tTcaAelbZrQAPMML4KiVpsfZ4-KhruDxTu_vAsb-5oLynyi9DnHuX3h4MqnUVRSUv5ioTZvT2g7Lxvwvfh90SZpKbYl8cQE0lh7DzhXywAeN7PptxY8TXRPfviJQkI01UoDVFbvkMDQ2ZzEmWEpdaH--DBZfkOSFPGFynqyVBo5BkumVRPr67WCPMfF0ewaR3N-72jbLHghFhcJoZrsMoFw7jvi8QfHGLceZISVXAuKSxVK5tK4a4Bd9rLjUpVMxdaQcRkxKdn3sM9SRN1AkQ6qsA8Q2XTFrUjgIuUQ5xwC3JKRNMNOGqEns4L6g0wjwEsViIKgq1isJSRU1oaCluxpUCbEKr0lNYnrVlaKPN0YGX75z-PesMtvHbflFv04J6tlipc4QSmbjI99An5bXFtA |
link.rule.ids | 315,786,790,802,27955,27956,55107 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3JTsMwEB0VOAAHtoIoqw9ckEjI4sT4iNjK0h5Ki3qL7NiREDRFbXKAr-Fb-DLGSVqxHbhFiq1YM_bMm8z4DcABO9GBTxNqBUngWTSQ0jK8ZhYNTxJPurFPmbko3GqHzR696Qf9GhxN78JorYviM22bxyKXr4Zxbn6VHWMYZ7JQMzCHft5h5W2tac6ABk7VrwCPMAL5SVLS4cfd9r2p4gps4_CZ535zQkVXlV-muPAvl8vQmqysLCt5svNM2vHbD9LG_y59BZYqoElOy52xCjWdrsHiF_rBOnSvxGAgrI54JaaDR6wV6RiqAqMrci4GaGpI74VkQ-JT5-O9NRKKPKbkAcPrYT4maBbSzDQtKsafjV4RaD6P16F3edE9a1pVlwUrxvA0s3yPUyE9LsJQIvwSDhfcU4pqxoWiidK-62qOyAXfGzY1JXUifOWymCuF7s_fgNl0mOpNIDTUDBGOUFw51I2ZUCiHhAlHCcollw04nIg9einJNKIiCHF4hCqKjIqiSkUNqBspTsdVAmzAzkRPUXXaxpGLVseEXqG39fesfZhvdlt30d11-3YbFvA7YVl9swOz2SjXuwgsMrlX7KdPfD3JCA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Gamma-Ray+Induced+Radiation+Damage+Up+to+340%C2%A0Mrad+in+Various+Scintillation+Crystals&rft.jtitle=IEEE+transactions+on+nuclear+science&rft.au=Yang%2C+Fan&rft.au=Zhang%2C+Liyuan&rft.au=Zhu%2C+Ren-Yuan&rft.date=2016-04-01&rft.issn=0018-9499&rft.eissn=1558-1578&rft.volume=63&rft.issue=2&rft.spage=612&rft.epage=619&rft_id=info:doi/10.1109%2FTNS.2015.2505721&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TNS_2015_2505721 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9499&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9499&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9499&client=summon |