Reliability analysis for systems subject to dependent and competing failure processes with random failure thresholds

• Published in: Quality engineering Vol. 35; no. 3; pp. 467 - 479
• Main Authors: Xia, Yuexin, Dong, Wenjie, Fang, Zhigeng
• Format: Journal Article
• Language: English
• Published: Milwaukee Taylor & Francis 03.07.2023; Taylor & Francis Ltd
• Subjects: Degradation; Dependent and competing failure processes (DCFPs); Distribution functions; Failure analysis; Goodness of fit; Microelectromechanical systems; Normal distribution; Parameter estimation; random failure thresholds; Reliability analysis; System reliability; Thresholds
• ISSN: 0898-2112; 1532-4222
• DOI: 10.1080/08982112.2022.2151369

This paper intends to investigate the reliability model for competing failure systems under the influence of random failure thresholds. The random threshold distribution function of hard failure is developed incorporating parameter estimation and goodness-of-fit analysis while the soft failure thres...