邱柯妮, 王. 杨. 赵. 张. 申. (2015). Multi-bits error detection and fast recovery in RISC cores. Journal of semiconductors, 36(11), 106-113. https://doi.org/10.1088/1674-4926/36/11/115009
Chicago Style (17th ed.) Citation邱柯妮, 王晶 杨星 赵元富 张伟功 申娇. "Multi-bits Error Detection and Fast Recovery in RISC Cores." Journal of Semiconductors 36, no. 11 (2015): 106-113. https://doi.org/10.1088/1674-4926/36/11/115009.
MLA (9th ed.) Citation邱柯妮, 王晶 杨星 赵元富 张伟功 申娇. "Multi-bits Error Detection and Fast Recovery in RISC Cores." Journal of Semiconductors, vol. 36, no. 11, 2015, pp. 106-113, https://doi.org/10.1088/1674-4926/36/11/115009.
Warning: These citations may not always be 100% accurate.