Bayesian and non-Bayesian inference for a general family of distributions based on simple step-stress life test using TRV model under type II censoring
In this article, we consider the parametric inference, using Type II censored data, based on the tampered random variable (TRV) model for simple step-stress life testing (SSLT). We have taken the members of the Lehmann family of distributions as the baseline lifetimes of the experimental units under...
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Published in | Sequential analysis Vol. 42; no. 4; pp. 349 - 370 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Philadelphia
Taylor & Francis
02.10.2023
Taylor & Francis Ltd |
Subjects | |
Online Access | Get full text |
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