Bayesian and non-Bayesian inference for a general family of distributions based on simple step-stress life test using TRV model under type II censoring

In this article, we consider the parametric inference, using Type II censored data, based on the tampered random variable (TRV) model for simple step-stress life testing (SSLT). We have taken the members of the Lehmann family of distributions as the baseline lifetimes of the experimental units under...

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Bibliographic Details
Published inSequential analysis Vol. 42; no. 4; pp. 349 - 370
Main Authors Dutta, Subhankar, Sultana, Farha, Kayal, Suchandan
Format Journal Article
LanguageEnglish
Published Philadelphia Taylor & Francis 02.10.2023
Taylor & Francis Ltd
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