Amdahl's law: a generalization under processor failures - Onyuksel, I.; Hosseini, S.H. (IEEE transactions on reliability, 1995)
Keywords: Applied sciences; Computer aided manufacturing; Concurrent computing; Degradation; Design. Technologies. Operation analysis. Testing; Electronics; Exact sciences and technology; Integrated circuits; Manufacturing processes; Queueing analysis; Random variables; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Stochastic processes; Time measurement; Velocity measurement; Very large scale integration; Performance evaluation; Multiprocessor; VLSI; Parallel processing; Metric; Reliability; Queueing network; Multiprocessing system; Performance coefficient; Method study