Calculation of the charge spreading along a carbon nanotube seen in scanning tunnelling microscopy (STM)

• Published in: Diamond and related materials Vol. 11; no. 3-6; pp. 961 - 963
• Main Authors: Márk, G.I., Koós, A., Osváth, Z., Biró, L.P., Gyulai, J., Benito, A.M., Maser, W.K., Thiry, P.A., Lambin, Ph
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.2002; Elsevier
• Subjects: Computer simulation; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Electron, ion, and scanning probe microscopy; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures; Electronic transport in interface structures; Exact sciences and technology; Materials science; Modeling; Nanoscale materials and structures: fabrication and characterization; Physics; Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc; Scanning tunnelling microscopy (STM); sp2 Bonding; Structure of solids and liquids; crystallography; Tunneling; Scanning tunnelling microscopy (STM); Computer simulation; Modeling; sp2 Bonding; Nonmetals; Tunnel effect; Theoretical study; Carbon nanotubes; Modelling; Computerized simulation; Nanostructures; Carbon; STM

Investigating the distribution of the scanning tunnelling microscopy (STM) current through a nanostructured material is a subject of great current interest. For this work, we calculated the transmission of an electron wave packet through a supported carbon nanotube by numerically solving the three-d...