Characterization of NbN/AlN/NbN tunnel junctions fabricated without intentional heating

• Published in: IEEE transactions on applied superconductivity Vol. 7; no. 2; pp. 2805 - 2808
• Main Authors: Iosad, N.N., Balashov, D.V., Kupriyanov, M.Yu, Polyakov, S.N., Roddatis, V.V.
• Format: Journal Article
• Language: English
• Published: IEEE 01.06.1997
• Subjects: Current density; Current measurement; Density measurement; Josephson junctions; Magnetic analysis; Niobium; Temperature; Voltage; X-ray diffraction; X-ray scattering

We have fabricated by SNEP process Nb/Al/NbN/AlN/NbN Josephson junctions with the gap voltage V/sub g/=2/spl Delta//e/spl ap/4.0 mV, subgap leakage R/sub sg//R/sub n//spl ap/6.0, current density measured at the gap current rise J/sub g//spl ap/1.5 kA/cm/sup 2/. The (111)-textured NbN with transition...