Remaining Useful Life Prediction for Tools Based on Monitoring Data and Stochastic Degradation Model - Zhang, Baokang; Li, Ning; Huang, Jiahui; Arakawa, Takahiro; Ishii, Kentaro; Yashima, Ryuichi (Journal of advanced computational intelligence and intelligent informatics, 2025)
Keywords: Accuracy; Artificial neural networks; Closed loops; Crack propagation; Degradation; Life prediction; Manufacturing; Mathematical functions; Methods; Neural networks; Parameter estimation; Random variables; Sensors; Stochastic models; Useful life