ANN-based error reduction for experimentally modeled sensors

A method for correcting the effects of multiple error sources in differential transducers is proposed. The correction is carried out by a nonlinear multidimensional inverse model of the transducer based on an artificial neural network. The model exploits independent information provided by the diffe...

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Published inIEEE transactions on instrumentation and measurement Vol. 51; no. 1; pp. 23 - 30
Main Authors Arpaia, P., Daponte, P., Grimaldi, D., Michaeli, L.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2002
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN0018-9456
1557-9662
DOI10.1109/19.989891

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Abstract A method for correcting the effects of multiple error sources in differential transducers is proposed. The correction is carried out by a nonlinear multidimensional inverse model of the transducer based on an artificial neural network. The model exploits independent information provided by the difference in actual characteristics of the sensing elements, and by an easily controllable auxiliary quantity (e.g., supply voltage of conditioning circuit). Experimental results of the correction of an eddy-current displacement transducer subject to the combined interference of structural and geometrical parameters highlight the practical effectiveness of the proposed method.
AbstractList A method for correcting the effects of multiple error sources in differential transducers is proposed. The correction is carried out by a nonlinear multidimensional inverse model of the transducer based on an artificial neural network. The model exploits independent information provided by the difference in actual characteristics of the sensing elements, and by an easily controllable auxiliary quantity (e.g., supply voltage of conditioning circuit). Experimental results of the correction of an eddy-current displacement transducer subject to the combined interference of structural and geometrical parameters highlight the practical effectiveness of the proposed method
A method for correcting the effects of multiple error sources in differential transducers is proposed. The correction is carried out by a nonlinear multidimensional inverse model of the transducer based on an artificial neural network. The model exploits independent information provided by the difference in actual characteristics of the sensing elements, and by an easily controllable auxiliary quantity (e.g., supply voltage of conditioning circuit). Experimental results of the correction of an eddy-current displacement transducer subject to the combined interference of structural and geometrical parameters highlight the practical effectiveness of the proposed method.
Author Arpaia, P.
Daponte, P.
Michaeli, L.
Grimaldi, D.
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Cites_doi 10.1109/19.310177
10.1109/19.650794
10.1109/19.744197
10.1109/NNSP.1994.366002
10.1109/19.552148
10.1109/IMTC.1999.776101
10.1016/S0263-2241(98)00013-X
10.1016/S0263-2241(99)00044-5
10.1016/0924-4247(94)00795-0
10.1109/19.368082
10.1109/19.492808
10.1109/IMTC.1996.507276
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References ref13
ref12
Haykin (ref18) 1994
Zell (ref20)
ref11
ref10
ref2
Simpson (ref17)
Luo (ref19) 1997
ref8
ref7
Norton (ref14) 1989
Bentley (ref1) 1988
ref9
ref4
ref3
ref6
ref5
Pallàs-Areny (ref15) 1991
References_xml – volume-title: Applied Neural Networks for Signal Processing
  year: 1997
  ident: ref19
– ident: ref2
  doi: 10.1109/19.310177
– ident: ref5
  doi: 10.1109/19.650794
– ident: ref7
  doi: 10.1109/19.744197
– ident: ref9
  doi: 10.1109/NNSP.1994.366002
– volume-title: Sensors and Signal Conditioning
  year: 1991
  ident: ref15
– ident: ref4
  doi: 10.1109/19.552148
– ident: ref13
  doi: 10.1109/IMTC.1999.776101
– ident: ref12
  doi: 10.1016/S0263-2241(98)00013-X
– start-page: 1
  volume-title: IEEE Technol. UPDATE SERIES—Neural Networks Theory, Technol. Applicat.
  ident: ref17
  article-title: Foundations of neural networks
– volume-title: Neural Networks
  year: 1994
  ident: ref18
– ident: ref10
  doi: 10.1016/S0263-2241(99)00044-5
– volume-title: Handbook of Transducers
  year: 1989
  ident: ref14
– ident: ref3
  doi: 10.1016/0924-4247(94)00795-0
– ident: ref6
  doi: 10.1109/19.368082
– ident: ref20
  publication-title: Stuttgart neural network simulator, user manual version 4.1
– ident: ref11
  doi: 10.1109/19.492808
– ident: ref8
  doi: 10.1109/IMTC.1996.507276
– volume-title: Principles of Measurement Systems
  year: 1988
  ident: ref1
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Snippet A method for correcting the effects of multiple error sources in differential transducers is proposed. The correction is carried out by a nonlinear...
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SubjectTerms Artificial neural networks
Circuits
Electric potential
Error correction
Error reduction
Instrumentation
Intelligent sensors
Interference
Inverse problems
Mathematical models
Multidimensional systems
Nonlinearity
Proposals
Transducers
Voltage
Voltage control
Title ANN-based error reduction for experimentally modeled sensors
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