Development of loop-mediated isothermal amplification assays for the rapid and accurate diagnosis of Exserohilum turcicum for field applications

Northern corn leaf blight (NCLB), caused by , is one of the most devastating foliar diseases of maize. Rapid and accurate diagnosis for this disease is urgently needed but still limited. Here, we establish a field-deployable diagnostic method to detect based on loop-mediated isothermal amplification...

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Published inPlant disease
Main Authors Wang, Zhenan, Guo, Lifang, Tan, Xiaoshan, Deng, Jili, Gong, Shengjie, Li, Dayong, Zhang, Junjie, Ruan, Changchun, Sun, Wenxian, Peng, Zhao, Hu, Ying
Format Journal Article
LanguageEnglish
Published United States 01.06.2024
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ISSN0191-2917
DOI10.1094/PDIS-10-23-2101-SR

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Abstract Northern corn leaf blight (NCLB), caused by , is one of the most devastating foliar diseases of maize. Rapid and accurate diagnosis for this disease is urgently needed but still limited. Here, we establish a field-deployable diagnostic method to detect based on loop-mediated isothermal amplification (LAMP) assays. A software application called K-mer Elimination by Cross-reference (KEC) was utilized to search for the specific sequences belonging to by comparing the whole genome sequence between and other known maize pathogens. Five LAMP primer sets were designed based on specific and single-copy fragments of . Post-LAMP analyses indicated that only the primer set, Et9468_set1, was the most suitable, producing a ladder-like amplification pattern in the agarose gel electrophoresis and a strong fluorescence signal in the presence of SYBR Green I. The LAMP assay using Et9468_set1 primers demonstrated a high level of specificity in distinguishing from six other common fungal pathogens of maize, as well as 12 more fungal and oomycete strains including the epiphytic fungi from maize leaves and other crop pathogens. Moreover, it exhibited remarkable sensitivity by detecting 5 copies per reaction which was approximately 10 times more sensitive compared to conventional PCR. The LAMP assay successfully detected in field maize leaves without DNA extraction, demonstrating its suitability for rapid on-spot detection of NCLB. Our study provides a direct LAMP diagnostic method to detect , which enables on-site pathogen detection in the field and the development of preventive strategies for NCLB management.
AbstractList Northern corn leaf blight (NCLB), caused by , is one of the most devastating foliar diseases of maize. Rapid and accurate diagnosis for this disease is urgently needed but still limited. Here, we establish a field-deployable diagnostic method to detect based on loop-mediated isothermal amplification (LAMP) assays. A software application called K-mer Elimination by Cross-reference (KEC) was utilized to search for the specific sequences belonging to by comparing the whole genome sequence between and other known maize pathogens. Five LAMP primer sets were designed based on specific and single-copy fragments of . Post-LAMP analyses indicated that only the primer set, Et9468_set1, was the most suitable, producing a ladder-like amplification pattern in the agarose gel electrophoresis and a strong fluorescence signal in the presence of SYBR Green I. The LAMP assay using Et9468_set1 primers demonstrated a high level of specificity in distinguishing from six other common fungal pathogens of maize, as well as 12 more fungal and oomycete strains including the epiphytic fungi from maize leaves and other crop pathogens. Moreover, it exhibited remarkable sensitivity by detecting 5 copies per reaction which was approximately 10 times more sensitive compared to conventional PCR. The LAMP assay successfully detected in field maize leaves without DNA extraction, demonstrating its suitability for rapid on-spot detection of NCLB. Our study provides a direct LAMP diagnostic method to detect , which enables on-site pathogen detection in the field and the development of preventive strategies for NCLB management.
Author Zhang, Junjie
Ruan, Changchun
Hu, Ying
Peng, Zhao
Gong, Shengjie
Deng, Jili
Guo, Lifang
Tan, Xiaoshan
Wang, Zhenan
Sun, Wenxian
Li, Dayong
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Keywords Fungi
maize pathogen
Field crops
Crop Type
cereals and grains
specificity
Pathogen detection
Causal Agent
visual detection
LAMP
sensitivity
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PublicationTitle Plant disease
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Snippet Northern corn leaf blight (NCLB), caused by , is one of the most devastating foliar diseases of maize. Rapid and accurate diagnosis for this disease is...
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Title Development of loop-mediated isothermal amplification assays for the rapid and accurate diagnosis of Exserohilum turcicum for field applications
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