A switching diffusion model for lifetime estimation in randomly varying environments

• Published in: IIE transactions Vol. 46; no. 11; pp. 1227 - 1241
• Main Authors: Flory, John A., Kharoufeh, Jeffrey P., Gebraeel, Nagi Z.
• Format: Journal Article
• Language: English
• Published: Norcross Taylor & Francis 02.11.2014; Taylor & Francis Ltd
• Subjects: Approximation; Degradation-based reliability; Markov analysis; Monte Carlo simulation; Parameter estimation; random environment; Simulation; Stochastic models; Studies

This article presents a switching diffusion model for estimating the useful lifetime of a component that operates in a randomly varying environment. The component's degradation process is unobservable; therefore, a signal of degradation is observed to estimate the environment parameters using a...