Surface micro-structuring of silicon by excimer-laser irradiation in reactive atmospheres

The formation mechanisms of cones and columns by pulsed-laser irradiation in reactive atmospheres were studied using scanning electron microscopy and profilometry. Deep etching takes place in SF6- and O2- rich atmospheres and consequently, silicon-containing molecules and clusters are released. Tran...

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Published inApplied surface science Vol. 168; no. 1-4; pp. 251 - 257
Main Authors Pedraza, A.J., Fowlkes, J.D., Jesse, S., Mao, C., Lowndes, D.H.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 15.12.2000
Elsevier Science
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Abstract The formation mechanisms of cones and columns by pulsed-laser irradiation in reactive atmospheres were studied using scanning electron microscopy and profilometry. Deep etching takes place in SF6- and O2- rich atmospheres and consequently, silicon-containing molecules and clusters are released. Transport of silicon from the etched/ablated regions to the tip of columns and cones and to the side of the cones is required because both structures, columns and cones, protrude above the initial surface. The laser-induced micro-structure is influenced not only by the nature but also by the partial pressure of the reactive gas in the atmosphere. Irradiation in Ar following cone formation in SF6 produced no additional growth but rather melting and resolidification. Subsequent irradiation using again a SF6 atmosphere lead to cone restructuring and growth resumption. Thus the effects of etching plus re-deposition that produce column/cone formation and growth are clearly separated from the effects of just melting. On the other hand, irradiation continued in air after first performed in SF6 resulted in: (a) an intense etching of the cones and a tendency to transform them into columns; (b) growth of new columns on top of the existing cones and (c) filamentary nano-structures coating the sides of the columns and cones.
AbstractList The formation mechanisms of cones and columns by pulsed-laser irradiation in reactive atmospheres were studied using scanning electron microscopy and profilometry. Deep etching takes place in SF6- and O2- rich atmospheres and consequently, silicon-containing molecules and clusters are released. Transport of silicon from the etched/ablated regions to the tip of columns and cones and to the side of the cones is required because both structures, columns and cones, protrude above the initial surface. The laser-induced micro-structure is influenced not only by the nature but also by the partial pressure of the reactive gas in the atmosphere. Irradiation in Ar following cone formation in SF6 produced no additional growth but rather melting and resolidification. Subsequent irradiation using again a SF6 atmosphere lead to cone restructuring and growth resumption. Thus the effects of etching plus re-deposition that produce column/cone formation and growth are clearly separated from the effects of just melting. On the other hand, irradiation continued in air after first performed in SF6 resulted in: (a) an intense etching of the cones and a tendency to transform them into columns; (b) growth of new columns on top of the existing cones and (c) filamentary nano-structures coating the sides of the columns and cones.
Author Fowlkes, J.D.
Pedraza, A.J.
Mao, C.
Lowndes, D.H.
Jesse, S.
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10.1063/1.360180
10.1016/0169-4332(89)90894-5
10.1063/1.106859
10.1016/0039-6028(92)90017-Z
10.1063/1.441132
10.1063/1.123838
10.1063/1.357014
10.1103/PhysRevB.30.2001
10.1016/S0169-4332(99)00369-4
10.1063/1.125332
10.1063/1.122241
10.1063/1.1703071
10.1103/PhysRevB.40.2031
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Issue 1-4
Keywords Laser-etching
Silicon
Nano-structures
Micro-columns
Laser-irradiation
Micro-cones
Physical radiation effects
Surface treatments
Experimental study
Microstructure
Pulsed lasers
Laser beam etching
Language English
License CC BY 4.0
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Elsevier Science
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References Young, Sipe, Preston, van Driel (BIB2) 1984; 30
Sanchez, Morenza, Trtik (BIB9) 1999; 75
Chuang (BIB11) 1981; 74
Clark, Emmony (BIB3) 1989; 40
Lowndes, Fowlkes, Pedraza (BIB7) 2000; 154/155
Her, Finlay, Wu, Deliwala, Mazur (BIB8) 1998; 73
Geohegan (BIB14) 1992; 60
Pedraza, Fowlkes, Lowndes (BIB5) 1999; 74
Ohkubo, Igari, Tomoda, Kusunoki (BIB12) 1992; 260
De Unamuno, Fogarassy (BIB10) 1989; 36
Balandin, Otte, Bostanjoglo (BIB15) 1995; 78
Brailovsky, Ezersky, Dorofeev, Ermakov, Luchin, Semenov (BIB4) 1991; 61
Nakamura, Kuroki, Kitajima (BIB13) 1994; 75
Birnbaum (BIB1) 1965; 36
Pedraza, Fowlkes, Lowndes (BIB6) 2000; 69
Sanchez (10.1016/S0169-4332(00)00611-5_BIB9) 1999; 75
Brailovsky (10.1016/S0169-4332(00)00611-5_BIB4) 1991; 61
Clark (10.1016/S0169-4332(00)00611-5_BIB3) 1989; 40
Lowndes (10.1016/S0169-4332(00)00611-5_BIB7) 2000; 154/155
Her (10.1016/S0169-4332(00)00611-5_BIB8) 1998; 73
Pedraza (10.1016/S0169-4332(00)00611-5_BIB6) 2000; 69
Geohegan (10.1016/S0169-4332(00)00611-5_BIB14) 1992; 60
Young (10.1016/S0169-4332(00)00611-5_BIB2) 1984; 30
Chuang (10.1016/S0169-4332(00)00611-5_BIB11) 1981; 74
De Unamuno (10.1016/S0169-4332(00)00611-5_BIB10) 1989; 36
Nakamura (10.1016/S0169-4332(00)00611-5_BIB13) 1994; 75
Birnbaum (10.1016/S0169-4332(00)00611-5_BIB1) 1965; 36
Ohkubo (10.1016/S0169-4332(00)00611-5_BIB12) 1992; 260
Balandin (10.1016/S0169-4332(00)00611-5_BIB15) 1995; 78
Pedraza (10.1016/S0169-4332(00)00611-5_BIB5) 1999; 74
References_xml – volume: 75
  start-page: 3302
  year: 1999
  ident: BIB9
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Trtik
– volume: 40
  start-page: 2031
  year: 1989
  ident: BIB3
  publication-title: Phys. Rev. B
  contributor:
    fullname: Emmony
– volume: 78
  start-page: 2037
  year: 1995
  ident: BIB15
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Bostanjoglo
– volume: 30
  start-page: 2001
  year: 1984
  ident: BIB2
  publication-title: Phys. Rev. B
  contributor:
    fullname: van Driel
– volume: 74
  start-page: 2322
  year: 1999
  ident: BIB5
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Lowndes
– volume: 74
  start-page: 1453
  year: 1981
  ident: BIB11
  publication-title: J. Chem. Phys.
  contributor:
    fullname: Chuang
– volume: 36
  start-page: 1
  year: 1989
  ident: BIB10
  publication-title: Appl. Surf. Sci.
  contributor:
    fullname: Fogarassy
– volume: 260
  start-page: 44
  year: 1992
  ident: BIB12
  publication-title: Surf. Sci.
  contributor:
    fullname: Kusunoki
– volume: 154/155
  start-page: 647
  year: 2000
  ident: BIB7
  publication-title: Appl. Surf. Sci
  contributor:
    fullname: Pedraza
– volume: 36
  start-page: 3688
  year: 1965
  ident: BIB1
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Birnbaum
– volume: 60
  start-page: 273
  year: 1992
  ident: BIB14
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Geohegan
– volume: 69
  start-page: S731
  year: 2000
  ident: BIB6
  publication-title: Appl. Phys. A
  contributor:
    fullname: Lowndes
– volume: 73
  start-page: 1673
  year: 1998
  ident: BIB8
  publication-title: Appl. Phys. Lett.
  contributor:
    fullname: Mazur
– volume: 75
  start-page: 4261
  year: 1994
  ident: BIB13
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Kitajima
– volume: 61
  start-page: 129
  year: 1991
  ident: BIB4
  publication-title: J. Tech. Phys.
  contributor:
    fullname: Semenov
– volume: 69
  start-page: S731
  year: 2000
  ident: 10.1016/S0169-4332(00)00611-5_BIB6
  publication-title: Appl. Phys. A
  doi: 10.1007/s003390051517
  contributor:
    fullname: Pedraza
– volume: 61
  start-page: 129
  year: 1991
  ident: 10.1016/S0169-4332(00)00611-5_BIB4
  publication-title: J. Tech. Phys.
  contributor:
    fullname: Brailovsky
– volume: 78
  start-page: 2037
  year: 1995
  ident: 10.1016/S0169-4332(00)00611-5_BIB15
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.360180
  contributor:
    fullname: Balandin
– volume: 36
  start-page: 1
  year: 1989
  ident: 10.1016/S0169-4332(00)00611-5_BIB10
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/0169-4332(89)90894-5
  contributor:
    fullname: De Unamuno
– volume: 60
  start-page: 273
  year: 1992
  ident: 10.1016/S0169-4332(00)00611-5_BIB14
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.106859
  contributor:
    fullname: Geohegan
– volume: 260
  start-page: 44
  year: 1992
  ident: 10.1016/S0169-4332(00)00611-5_BIB12
  publication-title: Surf. Sci.
  doi: 10.1016/0039-6028(92)90017-Z
  contributor:
    fullname: Ohkubo
– volume: 74
  start-page: 1453
  year: 1981
  ident: 10.1016/S0169-4332(00)00611-5_BIB11
  publication-title: J. Chem. Phys.
  doi: 10.1063/1.441132
  contributor:
    fullname: Chuang
– volume: 74
  start-page: 2322
  year: 1999
  ident: 10.1016/S0169-4332(00)00611-5_BIB5
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.123838
  contributor:
    fullname: Pedraza
– volume: 75
  start-page: 4261
  year: 1994
  ident: 10.1016/S0169-4332(00)00611-5_BIB13
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.357014
  contributor:
    fullname: Nakamura
– volume: 30
  start-page: 2001
  year: 1984
  ident: 10.1016/S0169-4332(00)00611-5_BIB2
  publication-title: Phys. Rev. B
  doi: 10.1103/PhysRevB.30.2001
  contributor:
    fullname: Young
– volume: 154/155
  start-page: 647
  year: 2000
  ident: 10.1016/S0169-4332(00)00611-5_BIB7
  publication-title: Appl. Surf. Sci.
  doi: 10.1016/S0169-4332(99)00369-4
  contributor:
    fullname: Lowndes
– volume: 75
  start-page: 3302
  year: 1999
  ident: 10.1016/S0169-4332(00)00611-5_BIB9
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.125332
  contributor:
    fullname: Sanchez
– volume: 73
  start-page: 1673
  year: 1998
  ident: 10.1016/S0169-4332(00)00611-5_BIB8
  publication-title: Appl. Phys. Lett.
  doi: 10.1063/1.122241
  contributor:
    fullname: Her
– volume: 36
  start-page: 3688
  year: 1965
  ident: 10.1016/S0169-4332(00)00611-5_BIB1
  publication-title: J. Appl. Phys.
  doi: 10.1063/1.1703071
  contributor:
    fullname: Birnbaum
– volume: 40
  start-page: 2031
  year: 1989
  ident: 10.1016/S0169-4332(00)00611-5_BIB3
  publication-title: Phys. Rev. B
  doi: 10.1103/PhysRevB.40.2031
  contributor:
    fullname: Clark
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Snippet The formation mechanisms of cones and columns by pulsed-laser irradiation in reactive atmospheres were studied using scanning electron microscopy and...
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StartPage 251
SubjectTerms Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Laser-etching
Laser-irradiation
Materials science
Micro-columns
Micro-cones
Nano-structures
Physics
Radiation treatment (particle and electromagnetic)
Radiation treatments
Silicon
Surface cleaning, etching, patterning
Surface treatments
Treatment of materials and its effects on microstructure and properties
Title Surface micro-structuring of silicon by excimer-laser irradiation in reactive atmospheres
URI https://dx.doi.org/10.1016/S0169-4332(00)00611-5
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