Compact Models for Simulation of On-Chip ESD Protection Networks - Rosenbaum, Elyse; Huang, Shudong; Drallmeier, Matthew; Zhou, Yujie (IEEE transactions on electron devices, 2024)
Keywords: Charged device model (CDM); compact models; Current measurement; electrostatic discharge (ESD) protection; Electrostatic discharge protection; Electrostatic discharges; Integrated circuit modeling; Pulse measurements; Semiconductor devices; silicon-controlled rectifier (SCR); System-on-chip; Transient analysis; Transmission line measurements; Verification