X-ray nanoscopy study on metal nano-structure formation at a metal-organic interface
Scanning transmission X-ray microscopy (STXM) with ~30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a poly (3-hexylthiophene) (P3HT) organic semiconducting layer with and without phenyl-C61-butyric acid methyl ester (PCBM). In the case of a P3...
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| Published in | Journal of the Korean Physical Society Vol. 69; no. 6; pp. 1085 - 1088 |
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| Main Authors | , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
Seoul
The Korean Physical Society
01.09.2016
Springer Nature B.V 한국물리학회 |
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| Online Access | Get full text |
| ISSN | 0374-4884 1976-8524 |
| DOI | 10.3938/jkps.69.1085 |
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| Abstract | Scanning transmission X-ray microscopy (STXM) with ~30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a poly (3-hexylthiophene) (P3HT) organic semiconducting layer with and without phenyl-C61-butyric acid methyl ester (PCBM). In the case of a P3HT/Al layer with a high-tensile-strain organic over-layer, the overall interface changed to a zagged morphology with Al nano pillars after thermal annealing. On the contrary, a P3HT:PCBM/Al layer with a less-tensile-strain organic over-layer showed a smooth interface except for a few nano pillars. These interfacial morphology changes were related to the initial strain status and to the relaxation process and the phase separation of P3HT crystals relating to the PCBM. Grazing-incident wide-angle X-ray scattering (GI-WAXS) measurements were also conducted to examine the residual strain and the crystalline properties of P3HT in the presence of PCBM. |
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| AbstractList | Scanning transmission X-ray microscopy (STXM) with ~30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a poly (3-hexylthiophene) (P3HT) organic semiconducting layer with and without phenyl-C61-butyric acid methyl ester (PCBM). In the case of a P3HT/Al layer with a high-tensile-strain organic over-layer, the overall interface changed to a zagged morphology with Al nano pillars after thermal annealing. On the contrary, a P3HT:PCBM/Al layer with a less-tensile-strain organic over-layer showed a smooth interface except for a few nano pillars. These interfacial morphology changes were related to the initial strain status and to the relaxation process and the phase separation of P3HT crystals relating to the PCBM. Grazing-incident wide-angle X-ray scattering (GI-WAXS) measurements were also conducted to examine the residual strain and the crystalline properties of P3HT in the presence of PCBM. Scanning transmission X-ray microscopy (STXM) with ∼30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a poly (3-hexylthiophene) (P3HT) organic semiconducting layer with and without phenyl-C61-butyric acid methyl ester (PCBM). In the case of a P3HT/Al layer with a high-tensile-strain organic over-layer, the overall interface changed to a zagged morphology with Al nano pillars after thermal annealing. On the contrary, a P3HT:PCBM/Al layer with a less-tensile-strain organic over-layer showed a smooth interface except for a few nano pillars. These interfacial morphology changes were related to the initial strain status and to the relaxation process and the phase separation of P3HT crystals relating to the PCBM. Grazing-incident wide-angle X-ray scattering (GI-WAXS) measurements were also conducted to examine the residual strain and the crystalline properties of P3HT in the presence of PCBM. KCI Citation Count: 1 |
| Author | Kim, Nam Dong Lee, Hyun Hwi Cho, Jung Hyeong Shin, Hyun-Joon Kim, Hyo Jung Lee, Si Woo Lee, Su Yong Jeon, Tae-Yeol |
| Author_xml | – sequence: 1 givenname: Si Woo surname: Lee fullname: Lee, Si Woo organization: Department of Organic Material Science and Engineering, Pusan National University – sequence: 2 givenname: Jung Hyeong surname: Cho fullname: Cho, Jung Hyeong organization: Department of Organic Material Science and Engineering, Pusan National University – sequence: 3 givenname: Hyo Jung surname: Kim fullname: Kim, Hyo Jung email: hyojkim@pusan.ac.kr organization: Department of Organic Material Science and Engineering, Pusan National University – sequence: 4 givenname: Su Yong surname: Lee fullname: Lee, Su Yong organization: Pohang Accelerator Laboratory, Pohang University of Science and Technology – sequence: 5 givenname: Hyun Hwi surname: Lee fullname: Lee, Hyun Hwi organization: Pohang Accelerator Laboratory, Pohang University of Science and Technology – sequence: 6 givenname: Nam Dong surname: Kim fullname: Kim, Nam Dong organization: Pohang Accelerator Laboratory, Pohang University of Science and Technology – sequence: 7 givenname: Hyun-Joon surname: Shin fullname: Shin, Hyun-Joon organization: Pohang Accelerator Laboratory, Pohang University of Science and Technology – sequence: 8 givenname: Tae-Yeol surname: Jeon fullname: Jeon, Tae-Yeol organization: Pohang Accelerator Laboratory, Pohang University of Science and Technology |
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| Cites_doi | 10.1143/JJAP.44.3695 10.1016/j.tsf.2014.01.038 10.1103/PhysRevB.80.235325 10.1063/1.118344 10.1039/b921624c 10.1002/adma.200601619 10.1016/j.orgel.2009.08.016 10.1063/1.1620683 10.1002/1616-3028(200110)11:5<374::AID-ADFM374>3.0.CO;2-W 10.1016/S0379-6779(98)80071-4 10.1143/APEX.5.051401 10.1016/j.solmat.2011.04.026 10.1063/1.4767445 10.1039/b925382c 10.1063/1.1331651 10.1002/marc.200900224 10.1063/1.1446988 |
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| Snippet | Scanning transmission X-ray microscopy (STXM) with ~30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a... Scanning transmission X-ray microscopy (STXM) with ∼30-nm spatial resolution revealed at annealing effect on the metal-organic interface of an Al layer with a... |
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| SubjectTerms | Annealing Butyric acid Mathematical and Computational Physics Morphology Particle and Nuclear Physics Phase separation Physics Physics and Astronomy Spatial resolution Theoretical X ray microscopy X-ray scattering 물리학 |
| Title | X-ray nanoscopy study on metal nano-structure formation at a metal-organic interface |
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