Choi, W., & Cha, Y. (2020). SDDNet: Real-Time Crack Segmentation. IEEE transactions on industrial electronics (1982), 67(9), 8016-8025. https://doi.org/10.1109/TIE.2019.2945265
Chicago Style (17th ed.) CitationChoi, Wooram, and Young-Jin Cha. "SDDNet: Real-Time Crack Segmentation." IEEE Transactions on Industrial Electronics (1982) 67, no. 9 (2020): 8016-8025. https://doi.org/10.1109/TIE.2019.2945265.
MLA (9th ed.) CitationChoi, Wooram, and Young-Jin Cha. "SDDNet: Real-Time Crack Segmentation." IEEE Transactions on Industrial Electronics (1982), vol. 67, no. 9, 2020, pp. 8016-8025, https://doi.org/10.1109/TIE.2019.2945265.
Warning: These citations may not always be 100% accurate.