Crystallization and oxidation behavior of Mo-Si-N coatings
Mo-Si-N coatings with different nitrogen concentrations were produced by nitrogen alloying simultaneously during sputter deposition from a planar magnetron MoSi 2 target with nitrogen plasma onto steel substrates. The ratio of molybdenum and silicon concentrations was 0.5. The nitrogen concentration...
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Published in | Surface & coatings technology Vol. 74; no. 1-3; pp. 981 - 985 |
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Main Authors | , , , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
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Lausanne
Elsevier B.V
01.10.1995
Elsevier |
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Abstract | Mo-Si-N coatings with different nitrogen concentrations were produced by nitrogen alloying simultaneously during sputter deposition from a planar magnetron MoSi
2 target with nitrogen plasma onto steel substrates. The ratio of molybdenum and silicon concentrations was 0.5. The nitrogen concentrations of the samples were 20, 35, and 50 at.% and the concentration profile was uniform througout the film thickness. The initial microstructure at all nitrogen concentrations involved was amorphous and the crystallization temperature was strongly dependent on nitrogen concentration. The sample with 50 at.% N was still amorphous after annealing at 1000°C whereas the sample with 35 at.% N was crystallized at 740-760°C and the sample with 20 at.% N at 660-680°C. Even this was higher than the crystallization temperature of a pure MoSi
2 coating, about 500°C. The oxidation behavior of the Mo-Si-N coatings with 50 at.% N was determined in wet oxidation conditions from 400 to 1000°C by measuring oxygen concentration on the surface using a nuclear reaction
16O(d,p)
17O or non-Rutherford scattering of He
+. The excellent oxidation resistance of this coating on low carbon steel was confirmed up to 800°C, above which diffusion of nitrogen occurred, resulting in crystallization and degrading of the beneficial properties. The oxidation behavior of the Mo-Si-N coating can be explained in terms of amorphous microstructure and silicon-nitrogen interaction. |
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AbstractList | Mo-Si-N coatings with different nitrogen concentrations were produced by nitrogen alloying simultaneously during sputter deposition from a planar magnetron MoSi
2 target with nitrogen plasma onto steel substrates. The ratio of molybdenum and silicon concentrations was 0.5. The nitrogen concentrations of the samples were 20, 35, and 50 at.% and the concentration profile was uniform througout the film thickness. The initial microstructure at all nitrogen concentrations involved was amorphous and the crystallization temperature was strongly dependent on nitrogen concentration. The sample with 50 at.% N was still amorphous after annealing at 1000°C whereas the sample with 35 at.% N was crystallized at 740-760°C and the sample with 20 at.% N at 660-680°C. Even this was higher than the crystallization temperature of a pure MoSi
2 coating, about 500°C. The oxidation behavior of the Mo-Si-N coatings with 50 at.% N was determined in wet oxidation conditions from 400 to 1000°C by measuring oxygen concentration on the surface using a nuclear reaction
16O(d,p)
17O or non-Rutherford scattering of He
+. The excellent oxidation resistance of this coating on low carbon steel was confirmed up to 800°C, above which diffusion of nitrogen occurred, resulting in crystallization and degrading of the beneficial properties. The oxidation behavior of the Mo-Si-N coating can be explained in terms of amorphous microstructure and silicon-nitrogen interaction. |
Author | Hirvonen, J.-P. Kattelus, H. Lappalainen, R. Torri, P. Tesmer, J.R. Nastasi, M. Jervis, T.R. Kung, H. Suni, I. |
Author_xml | – sequence: 1 givenname: J.-P. surname: Hirvonen fullname: Hirvonen, J.-P. organization: VTT Manufacturing Technology, PO Box 1703, FIN-02044 VTT, Finland – sequence: 2 givenname: I. surname: Suni fullname: Suni, I. organization: VTT Electronics, PO Box 1101, FIN-02044 VTT, Finland – sequence: 3 givenname: H. surname: Kattelus fullname: Kattelus, H. organization: VTT Electronics, PO Box 1101, FIN-02044 VTT, Finland – sequence: 4 givenname: R. surname: Lappalainen fullname: Lappalainen, R. organization: Department of Physics, FIN-00014 University of Helsinki, Finland – sequence: 5 givenname: P. surname: Torri fullname: Torri, P. organization: Department of Physics, FIN-00014 University of Helsinki, Finland – sequence: 6 givenname: H. surname: Kung fullname: Kung, H. organization: Los Alamos National Laboratory, Los Alamos, NM 87545, USA – sequence: 7 givenname: T.R. surname: Jervis fullname: Jervis, T.R. organization: Los Alamos National Laboratory, Los Alamos, NM 87545, USA – sequence: 8 givenname: M. surname: Nastasi fullname: Nastasi, M. organization: Los Alamos National Laboratory, Los Alamos, NM 87545, USA – sequence: 9 givenname: J.R. surname: Tesmer fullname: Tesmer, J.R. organization: Los Alamos National Laboratory, Los Alamos, NM 87545, USA |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3158325$$DView record in Pascal Francis |
BookMark | eNp9jz1PwzAQhi1UJErhHzBkYIDB4K80NgMSqviSCgzAbDn2GYxCXNlRRfn1JAR1ZDrd3fPe6dlHkza2gNARJWeU0Pk5YWWFparYiSpPieSs73bQlMpKYc5FNUHTLbKH9nP-IITQSokpulikTe5M04Rv04XYFqZ1RfwKbuxqeDfrEFMRffEQ8XPAj4WN_a59ywdo15smw-FfnaHXm-uXxR1ePt3eL66W2HLOOyy8I4KCp4qXiikunAMnKlkDcwyMkMLVdBgb5WugwK3kfG4dzIVk1ng-Q2K8a1PMOYHXqxQ-TdpoSvTgrwc5PchpVepffy372PEYW5lsTeOTaW3I2yynZQ-WPXY5YtArrAMknW2A1oILCWynXQz___kBP1Rwiw |
CODEN | SCTEEJ |
CitedBy_id | crossref_primary_10_1016_j_surfcoat_2006_08_048 crossref_primary_10_1116_1_1996612 crossref_primary_10_1016_j_surfcoat_2020_126238 crossref_primary_10_1557_JMR_1999_0481 crossref_primary_10_1016_S0042_207X_00_00338_9 crossref_primary_10_1063_1_2841810 crossref_primary_10_1111_j_1460_2695_2005_00887_x crossref_primary_10_1016_j_jcrysgro_2003_11_005 crossref_primary_10_1016_S0167_9317_01_00585_8 crossref_primary_10_1016_S0040_6090_98_01568_5 crossref_primary_10_1016_j_surfcoat_2023_129654 crossref_primary_10_3390_coatings10010034 crossref_primary_10_1016_S0167_9317_00_00468_8 crossref_primary_10_1557_JMR_2005_0169 crossref_primary_10_1016_j_apsusc_2005_11_038 crossref_primary_10_1016_j_corsci_2021_109473 crossref_primary_10_1016_j_tsf_2011_11_025 |
Cites_doi | 10.1016/0168-583X(85)90498-7 10.1557/JMR.1993.0214 10.1103/PhysRevB.34.3076 |
ContentType | Journal Article Conference Proceeding |
Copyright | 1995 Elsevier Science S.A. 1996 INIST-CNRS |
Copyright_xml | – notice: 1995 Elsevier Science S.A. – notice: 1996 INIST-CNRS |
DBID | IQODW AAYXX CITATION |
DOI | 10.1016/0257-8972(95)08327-8 |
DatabaseName | Pascal-Francis CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Chemistry Physics |
EISSN | 1879-3347 |
EndPage | 985 |
ExternalDocumentID | 10_1016_0257_8972_95_08327_8 3158325 0257897295083278 |
GroupedDBID | --K --M .~1 0R~ 123 1B1 1RT 1~. 1~5 29Q 4.4 457 4G. 5VS 7-5 71M 8P~ 9JN AABNK AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABFRF ABMAC ABNEU ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFS ACIWK ACNNM ACRLP ADBBV ADEZE ADMUD AEBSH AEFWE AEKER AENEX AEZYN AFKWA AFRZQ AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BKOJK BLXMC CS3 DU5 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 FDB FEDTE FGOYB FIRID FNPLU FYGXN G-2 G-Q GBLVA HMV HVGLF HX~ HZ~ IHE J1W KOM M24 M38 M41 MAGPM MO0 N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SMS SPC SPCBC SPD SPG SSM SSQ SSZ T5K WUQ XFK XPP ZMT ~02 ~G- ABPIF ABPTK IQODW AAXKI AAYXX AFJKZ AKRWK CITATION |
ID | FETCH-LOGICAL-c333t-4fd041ef193592934dded478be2d2ea484db1934da9fbe1e3c8336cde6482caf3 |
IEDL.DBID | .~1 |
ISSN | 0257-8972 |
IngestDate | Thu Sep 26 18:33:36 EDT 2024 Sun Oct 22 16:08:17 EDT 2023 Fri Feb 23 02:32:23 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1-3 |
Keywords | Oxidation Amorphous coatings Crystallization Ion beam analysis Surface treatments Nitrogen Experimental study Coatings Molybdenum Amorphous phase Phase transitions Sputtering Thin films Thickness Magnetrons Physical vapor deposition Silicon Microstructure Concentration distribution |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | International Conference on Plasma Surface Engineering |
MergedId | FETCHMERGED-LOGICAL-c333t-4fd041ef193592934dded478be2d2ea484db1934da9fbe1e3c8336cde6482caf3 |
PageCount | 5 |
ParticipantIDs | crossref_primary_10_1016_0257_8972_95_08327_8 pascalfrancis_primary_3158325 elsevier_sciencedirect_doi_10_1016_0257_8972_95_08327_8 |
PublicationCentury | 1900 |
PublicationDate | 1995-10-01 |
PublicationDateYYYYMMDD | 1995-10-01 |
PublicationDate_xml | – month: 10 year: 1995 text: 1995-10-01 day: 01 |
PublicationDecade | 1990 |
PublicationPlace | Lausanne |
PublicationPlace_xml | – name: Lausanne |
PublicationTitle | Surface & coatings technology |
PublicationYear | 1995 |
Publisher | Elsevier B.V Elsevier |
Publisher_xml | – name: Elsevier B.V – name: Elsevier |
References | Hirvonen, Lappalainen, Anttila, Sirviö (bib6) 1989 Chou, Nieh (bib4) 1993; 8 Hirvonen, Suni, Kattelus, Lappalainen, Torri, Kung, Jervis, Nastasi (bib3) 1994; 322 J.R. Tesmer and M. Nastasi (eds.), Handbook of Modern Ion Beam Analysis, Appendix 7, Materials Research Society, Pittsburgh, PA, in press. Rauhala (bib8) 1985; 12 Schlichting (bib1) 1978; 10 Petrovic, Vasudevan (bib2) 1992; 273 Lappalainen (bib5) 1986; 34 (bib9) 1992 Schlichting (10.1016/0257-8972(95)08327-8_bib1) 1978; 10 Hirvonen (10.1016/0257-8972(95)08327-8_bib6) 1989 Lappalainen (10.1016/0257-8972(95)08327-8_bib5) 1986; 34 Petrovic (10.1016/0257-8972(95)08327-8_bib2) 1992; 273 Chou (10.1016/0257-8972(95)08327-8_bib4) 1993; 8 10.1016/0257-8972(95)08327-8_bib7 Rauhala (10.1016/0257-8972(95)08327-8_bib8) 1985; 12 Hirvonen (10.1016/0257-8972(95)08327-8_bib3) 1994; 322 (10.1016/0257-8972(95)08327-8_bib9) 1992 |
References_xml | – volume: 8 start-page: 214 year: 1993 ident: bib4 publication-title: J. Mater. Res. contributor: fullname: Nieh – volume: 273 start-page: 229 year: 1992 ident: bib2 publication-title: Mater. Res. Soc. Symp. Proc. contributor: fullname: Vasudevan – volume: 322 start-page: 279 year: 1994 ident: bib3 publication-title: Mater. Res. Soc. Symp. Proc. contributor: fullname: Nastasi – start-page: 169 year: 1992 ident: bib9 publication-title: Phase Diagrams of Ternary Boron Nitride and Silicon Nitride Systems – volume: 34 start-page: 3076 year: 1986 ident: bib5 publication-title: Phys. Rev. B contributor: fullname: Lappalainen – volume: 12 start-page: 447 year: 1985 ident: bib8 publication-title: Nucl. Instrum. Methods B contributor: fullname: Rauhala – volume: 10 start-page: 241 year: 1978 ident: bib1 publication-title: High Temp. — High Pressures contributor: fullname: Schlichting – start-page: 721 year: 1989 ident: bib6 publication-title: Plasma Surface Engineering contributor: fullname: Sirviö – volume: 273 start-page: 229 year: 1992 ident: 10.1016/0257-8972(95)08327-8_bib2 contributor: fullname: Petrovic – ident: 10.1016/0257-8972(95)08327-8_bib7 – volume: 322 start-page: 279 year: 1994 ident: 10.1016/0257-8972(95)08327-8_bib3 contributor: fullname: Hirvonen – volume: 12 start-page: 447 year: 1985 ident: 10.1016/0257-8972(95)08327-8_bib8 publication-title: Nucl. Instrum. Methods B doi: 10.1016/0168-583X(85)90498-7 contributor: fullname: Rauhala – start-page: 721 year: 1989 ident: 10.1016/0257-8972(95)08327-8_bib6 contributor: fullname: Hirvonen – volume: 8 start-page: 214 year: 1993 ident: 10.1016/0257-8972(95)08327-8_bib4 publication-title: J. Mater. Res. doi: 10.1557/JMR.1993.0214 contributor: fullname: Chou – volume: 34 start-page: 3076 year: 1986 ident: 10.1016/0257-8972(95)08327-8_bib5 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.34.3076 contributor: fullname: Lappalainen – start-page: 169 year: 1992 ident: 10.1016/0257-8972(95)08327-8_bib9 – volume: 10 start-page: 241 year: 1978 ident: 10.1016/0257-8972(95)08327-8_bib1 publication-title: High Temp. — High Pressures contributor: fullname: Schlichting |
SSID | ssj0001794 |
Score | 1.6034697 |
Snippet | Mo-Si-N coatings with different nitrogen concentrations were produced by nitrogen alloying simultaneously during sputter deposition from a planar magnetron... |
SourceID | crossref pascalfrancis elsevier |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 981 |
SubjectTerms | Amorphous coatings Cross-disciplinary physics: materials science; rheology Crystallization Deposition by sputtering Exact sciences and technology Ion beam analysis Materials science Methods of deposition of films and coatings; film growth and epitaxy Oxidation Physics |
Title | Crystallization and oxidation behavior of Mo-Si-N coatings |
URI | https://dx.doi.org/10.1016/0257-8972(95)08327-8 |
Volume | 74 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1NSwMxEA1SDyoiWhWrtuTgQQ9xP5L9iLdSLFVpL1roLSTZBAplt7QV9OJvN8nu1vYggtchm11ehpnJMm8eADe-iKkKsUbCXHUQoTxGQgirmoplKLDMYifaNxzFgzF5nkSTDS6MbausYn8Z0120rixehaY3n0493zobNbWhHWgeJpbvS0z2My59__XT5WH9zf1miUwwNqtr9lwQe2vbLY3u3B4o_S07Hc750mCmS7GLjQzUPwZHVekIu-XXnYAdlTfBXq9WbGuCg43hgqfgobf4NKXfbFYxLSHPM1h8TEsRJVjz82Gh4bBAr1M0grLgtgt6eQbG_ce33gBVSglIYoxXiOjMJ4HSgeXZmgROTNDKSJIKFWah4iQlmQismVMtVKCwTDGOZaZikoaSa3wOGnmRqwsAzY1KBZTyUMaScBlyU0CmQnOc-JyQiLYAqhFi83IgBqs7xSyizCLKaMQcoixtgaSGkW0dLDMx-48n21uor1-Hg8isiC7_vfMV2HfMdNeTdw0aq8W7apvaYiU6zns6YLf79DIYfQOnMskC |
link.rule.ids | 310,311,315,783,787,792,793,4509,23942,23943,24128,25152,27936,27937,45597,45691 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3PS8MwFA46D1NEdCpOnfbgQQ9xbZK2iTcZjqnbLm6wW0jSFAqjHdsEvfi3m_TH3A4ieH2kafny-N5Led97ANy4MmAa4RhKc9WBhIkASint1FSskMQqCvKhfYNh0BuTl4k_WdPC2LLKkvsLTs_ZurS0SzTbsyRpu9bZmMkNbUNzFNJtsENsemx8-v7rp8zDOlz-n8U3bGyWV_I5L2ivbLfMv8s3gfS38LQ_EwsDWlxMu1gLQd1DcFDmjs5j8XlHYEunDVDvVCPbGmBvrbvgMXjozD9N7jedllJLR6SRk30kxRQlpxLoO1nsDDL4lsChozJhy6AXJ2DcfRp1erAclQAVxngJSRy5xNOxZ4W2JoITw1oRCanUKEJaEEoi6VmzYLHUnsaKYhyoSAeEIiVifApqaZbqM-CYK5X2GBNIBYoIhYTJIKmMBQ5dQYjPmgBWCPFZ0RGDV6ViFlFuEeXM5zminDZBWMHIN06WG9L-48nWBuqr12HPNyv883_vfA3qvdGgz_vPw9cLsJvL1PMCvUtQW87fdcskGkt5lXvSN5Fjyps |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Surface+%26+coatings+technology&rft.atitle=Crystallization+and+oxidation+behavior+of+Mo-Si-N+coatings&rft.au=HIRVONEN%2C+J.-P&rft.au=SUNI%2C+I&rft.au=KATTELUS%2C+H&rft.au=LAPPALAINEN%2C+R&rft.date=1995-10-01&rft.pub=Elsevier&rft.issn=0257-8972&rft.eissn=1879-3347&rft.volume=74-75&rft.issue=1-3&rft.spage=981&rft.epage=985&rft_id=info:doi/10.1016%2F0257-8972%2895%2908327-8&rft.externalDBID=n%2Fa&rft.externalDocID=3158325 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0257-8972&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0257-8972&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0257-8972&client=summon |