Stress-induced changes of thermal donor formation in heat-treated Czochralski-grown silicon
Formation processes of oxygen-related thermal donors in Czochralski-grown silicon annealed at T=450°C under high hydrostatic pressures at P⩾1GPa are studied by means of electrical and optical measurements. As for heat treatment of materials at atmospheric pressure, the formation of thermal double do...
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Published in | Physica. B, Condensed matter Vol. 340-342; pp. 769 - 772 |
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Main Authors | , , , , , , , , |
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Elsevier B.V
31.12.2003
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Abstract | Formation processes of oxygen-related thermal donors in Czochralski-grown silicon annealed at T=450°C under high hydrostatic pressures at P⩾1GPa are studied by means of electrical and optical measurements. As for heat treatment of materials at atmospheric pressure, the formation of thermal double donors (TDDs) takes also place in Czochralski-grown silicon subjected to compressive stresses during heat treatment. However, their formation rate turned out to be much larger than that observed under normal conditions, even in carbon-rich materials. This strongly enhanced formation of thermal donors is believed to be due to increasing diffusivity of oxygen under pressures. In addition to the TDDs, other shallow and deep thermal donors are also making their appearance in silicon heat treated under high pressures. |
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AbstractList | Formation processes of oxygen-related thermal donors in Czochralski-grown silicon annealed at T = 450 deg C under high hydrostatic pressures at P# > 1GPa are studied by means of electrical and optical measurements. As for heat treatment of materials at atmospheric pressure, the formation of thermal double donors (TDDs) takes also place in Czochralski-grown silicon subjected to compressive stresses during heat treatment. However, their formation rate turned out to be much larger than that observed under normal conditions, even in carbon-rich materials. This strongly enhanced formation of thermal donors is believed to be due to increasing diffusivity of oxygen under pressures. In addition to the TDDs, other shallow and deep thermal donors are also making their appearance in silicon heat treated under high pressures. Formation processes of oxygen-related thermal donors in Czochralski-grown silicon annealed at T=450°C under high hydrostatic pressures at P⩾1GPa are studied by means of electrical and optical measurements. As for heat treatment of materials at atmospheric pressure, the formation of thermal double donors (TDDs) takes also place in Czochralski-grown silicon subjected to compressive stresses during heat treatment. However, their formation rate turned out to be much larger than that observed under normal conditions, even in carbon-rich materials. This strongly enhanced formation of thermal donors is believed to be due to increasing diffusivity of oxygen under pressures. In addition to the TDDs, other shallow and deep thermal donors are also making their appearance in silicon heat treated under high pressures. |
Author | Emtsev, V.V. Shmagin, V.B. Kryzhkov, D.I. Misiuk, A. Andreev, B.A. Davydov, V.Yu Poloskin, D.S. Oganesyan, G.A. Londos, C.A. |
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Cites_doi | 10.1016/j.physb.2003.09.272 10.1103/PhysRevB.62.10824 10.1002/pssb.200301535 10.1016/S0921-4526(98)00372-X 10.1063/1.119527 10.1007/BF00616290 10.1103/PhysRevB.46.4312 10.1016/0921-5107(95)01282-6 |
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Title | Stress-induced changes of thermal donor formation in heat-treated Czochralski-grown silicon |
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