Microstructural Degradation of Ni/YSZ Electrodes in Solid Oxide Electrolysis Cells under High Current

Ni/yttria stabilized zirconia (YSZ) supported solid oxide electrolysis cells (SOECs) were exposed to long-term galvanostatic electrolysis tests, under different testing conditions (temperature, gas composition, current density etc.) with an emphasis on high current density (above −1 A/cm2). Detailed...

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Published inJournal of the Electrochemical Society Vol. 160; no. 8; pp. F883 - F891
Main Authors Chen, Ming, Liu, Yi-Lin, Bentzen, Janet Jonna, Zhang, Wei, Sun, Xiufu, Hauch, Anne, Tao, Youkun, Bowen, Jacob R., Hendriksen, Peter Vang
Format Journal Article
LanguageEnglish
Published The Electrochemical Society 01.01.2013
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Summary:Ni/yttria stabilized zirconia (YSZ) supported solid oxide electrolysis cells (SOECs) were exposed to long-term galvanostatic electrolysis tests, under different testing conditions (temperature, gas composition, current density etc.) with an emphasis on high current density (above −1 A/cm2). Detailed post-mortem characterizations were carried out to investigate microstructural changes after long-term galvanostatic tests, focusing on the Ni/YSZ electrode. Formation of ZrO2 nano-particles on Ni surfaces was observed in cells exposed to −1 or −1.5 A/cm2 at 800 or 850°C, but not in those tested at current densities below −0.75 A/cm2. The formation of ZrO2 nano-particles deteriorates Ni percolation and presumably decreases the number of active triple phase boundaries (TPBs) and is therefore considered a degradation phenomenon. It is hypothesized that the degradation of the Ni surface is a result of Ni-YSZ interfacial reactions, taking place under the conditions prevailing under strong polarization. A mechanism for the formation of ZrO2 nano-particles on the Ni surface under the electrolysis cell testing is proposed and the possibility of Ni-YSZ interfacial reactions under such conditions (T, p(O2)) is further elucidated by thermodynamic calculations.
Bibliography:098308JES
ISSN:0013-4651
1945-7111
DOI:10.1149/2.098308jes