Chen, M., Liu, Y., Bentzen, J. J., Zhang, W., Sun, X., Hauch, A., . . . Hendriksen, P. V. (2013). Microstructural Degradation of Ni/YSZ Electrodes in Solid Oxide Electrolysis Cells under High Current. Journal of the Electrochemical Society, 160(8), F883-F891. https://doi.org/10.1149/2.098308jes
Chicago Style (17th ed.) CitationChen, Ming, Yi-Lin Liu, Janet Jonna Bentzen, Wei Zhang, Xiufu Sun, Anne Hauch, Youkun Tao, Jacob R. Bowen, and Peter Vang Hendriksen. "Microstructural Degradation of Ni/YSZ Electrodes in Solid Oxide Electrolysis Cells Under High Current." Journal of the Electrochemical Society 160, no. 8 (2013): F883-F891. https://doi.org/10.1149/2.098308jes.
MLA (9th ed.) CitationChen, Ming, et al. "Microstructural Degradation of Ni/YSZ Electrodes in Solid Oxide Electrolysis Cells Under High Current." Journal of the Electrochemical Society, vol. 160, no. 8, 2013, pp. F883-F891, https://doi.org/10.1149/2.098308jes.