APA (7th ed.) Citation

Segura, S., Towey, D., Zhou, Z. Q., & Chen, T. Y. (2020). Metamorphic Testing: Testing the Untestable. IEEE software, 37(3), 46-53. https://doi.org/10.1109/MS.2018.2875968

Chicago Style (17th ed.) Citation

Segura, Sergio, Dave Towey, Zhi Quan Zhou, and Tsong Yueh Chen. "Metamorphic Testing: Testing the Untestable." IEEE Software 37, no. 3 (2020): 46-53. https://doi.org/10.1109/MS.2018.2875968.

MLA (9th ed.) Citation

Segura, Sergio, et al. "Metamorphic Testing: Testing the Untestable." IEEE Software, vol. 37, no. 3, 2020, pp. 46-53, https://doi.org/10.1109/MS.2018.2875968.