Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy

• Published in: Journal of physical and chemical reference data Vol. 49; no. 3
• Main Authors: Jablonski, A., Powell, C. J.
• Format: Journal Article
• Language: English
• Published: 01.09.2020
• Subjects: surface analysis; databases; predictive equations; effective attenuation length; x-ray photoelectron spectroscopy

The effective attenuation length (EAL) is a useful parameter in quantitative applications of x-ray photoelectron spectroscopy (XPS). This parameter is used in place of the inelastic mean free path (IMFP) in expressions for different XPS applications to correct those expressions for elastic scatterin...