Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress - 汤兰凤 于广 陆海 武辰飞 钱慧敏 周东 张荣 郑有炓 黄晓明 (Chinese physics B, 2015)
Keywords: amorphous; Carriers; Devices; effect; thin; gallium; Gates; Illumination; indium; oxide; illumination; detrapping; states; Stresses; Thin film transistors; Threshold voltage; transistors; interface; White light; zinc