黄晓明, 汤. 于. 陆. 武. 钱. 周. 张. 郑. (2015). Influence of white light illumination on the performance of a-IGZO thin film transistor under positive gate-bias stress. Chinese physics B, 24(8), 619-623. https://doi.org/10.1088/1674-1056/24/8/088504
Chicago Style (17th ed.) Citation黄晓明, 汤兰凤 于广 陆海 武辰飞 钱慧敏 周东 张荣 郑有炓. "Influence of White Light Illumination on the Performance of A-IGZO Thin Film Transistor Under Positive Gate-bias Stress." Chinese Physics B 24, no. 8 (2015): 619-623. https://doi.org/10.1088/1674-1056/24/8/088504.
MLA (9th ed.) Citation黄晓明, 汤兰凤 于广 陆海 武辰飞 钱慧敏 周东 张荣 郑有炓. "Influence of White Light Illumination on the Performance of A-IGZO Thin Film Transistor Under Positive Gate-bias Stress." Chinese Physics B, vol. 24, no. 8, 2015, pp. 619-623, https://doi.org/10.1088/1674-1056/24/8/088504.