Total Ionizing Dose Effects in MOS and Low-Dose-Rate-Sensitive Linear-Bipolar Devices - Fleetwood, D. M. (IEEE transactions on nuclear science, 2013)
Keywords: Charge carrier processes; Defects; ELDRS; hole traps; hydrogen; Integrated circuit modeling; interface traps; linear bipolar; Logic gates; MOS; MOS capacitors; Radiation effects; Silicon; total ionizing dose