Room-temperature low-threshold current-injection InGaAs quantum-dot microdisk lasers with single-mode emission

We fabricated current-injection InGaAs quantum-dot microdisk lasers with benzocyclobutene cladding in this work. The microdisk pedestal diameter is carefully designed to facilitate carrier injection and modal control. With this structure, low threshold current of 0.45 mA is achieved at room temperat...

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Published inOptics express Vol. 19; no. 15; pp. 14145 - 14151
Main Authors Mao, Ming-Hua, Chien, Hao-Che, Hong, Jay-Zway, Cheng, Chih-Yi
Format Journal Article
LanguageEnglish
Published United States 18.07.2011
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Abstract We fabricated current-injection InGaAs quantum-dot microdisk lasers with benzocyclobutene cladding in this work. The microdisk pedestal diameter is carefully designed to facilitate carrier injection and modal control. With this structure, low threshold current of 0.45 mA is achieved at room temperature from a device of 6.5 μm in diameter with single-mode emission from quantum-dot ground states. The negative characteristic temperature T0 of threshold current is observed between 80 K and 150 K. The transition temperature from negative T0 to positive T0 is 150 K which is higher than that of the edge-emitting lasers fabricated from the same wafer. This phenomenon indicates the lower loss level of our microdisk cavities. These microdisk lasers also show positive T0 significantly higher than that of the edge-emitting lasers from the same wafer.
AbstractList We fabricated current-injection InGaAs quantum-dot microdisk lasers with benzocyclobutene cladding in this work. The microdisk pedestal diameter is carefully designed to facilitate carrier injection and modal control. With this structure, low threshold current of 0.45 mA is achieved at room temperature from a device of 6.5 μm in diameter with single-mode emission from quantum-dot ground states. The negative characteristic temperature T0 of threshold current is observed between 80 K and 150 K. The transition temperature from negative T0 to positive T0 is 150 K which is higher than that of the edge-emitting lasers fabricated from the same wafer. This phenomenon indicates the lower loss level of our microdisk cavities. These microdisk lasers also show positive T0 significantly higher than that of the edge-emitting lasers from the same wafer.
Author Cheng, Chih-Yi
Mao, Ming-Hua
Chien, Hao-Che
Hong, Jay-Zway
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Snippet We fabricated current-injection InGaAs quantum-dot microdisk lasers with benzocyclobutene cladding in this work. The microdisk pedestal diameter is carefully...
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