A novel degradation-rate-volatility related effect Wiener process model with its extension to accelerated ageing data analysis

• Published in: Reliability engineering & system safety Vol. 204; p. 107138
• Main Authors: Yan, Bingxin, Ma, Xiaobing, Yang, Li, Wang, Han, Wu, Tianyi
• Format: Journal Article
• Language: English
• Published: Barking Elsevier Ltd 01.12.2020; Elsevier BV
• Subjects: Accelerated ageing test; Accelerated aging tests; Accelerated tests; Aging; Correlation analysis; Data analysis; Degradation; Degradation-rate-volatility related effect; Diffusion coefficient; Error reduction; Linear functions; Model accuracy; Prognosis; Reliability engineering; Silicon rubber; Statistical inference; Systematic error; Systematic errors; Volatility; Wiener process; Wiener process; Accelerated ageing test; Degradation-rate-volatility related effect; Systematic error; Silicon rubber

•We propose a novel degradation-rate-volatility related effect Wiener process model.•Model-RV has high accuracy in ageing process modeling and RUL prediction.•We extend Model-RV to AAT by incorporating stress-acceleration models.•A set of 3S-60 silicon rubber accelerated ageing data is used for illu...