Modeling dynamic environment effects on dependent failure processes with varying failure thresholds
Devices usually fail due to multiple dependent competing failure processes resulting from internal degradation and random shocks, whose behavior may vary in different environments. This paper focuses on systems suffering from randomly occurring shocks described by Poisson processes and internal degr...
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Published in | Reliability engineering & system safety Vol. 229; p. 108848 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Barking
Elsevier Ltd
01.01.2023
Elsevier BV |
Subjects | |
Online Access | Get full text |
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