Modeling dynamic environment effects on dependent failure processes with varying failure thresholds

Devices usually fail due to multiple dependent competing failure processes resulting from internal degradation and random shocks, whose behavior may vary in different environments. This paper focuses on systems suffering from randomly occurring shocks described by Poisson processes and internal degr...

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Bibliographic Details
Published inReliability engineering & system safety Vol. 229; p. 108848
Main Authors Wu, Bei, Wei, Xiaohua, Zhang, Yamei, Bai, Sijun
Format Journal Article
LanguageEnglish
Published Barking Elsevier Ltd 01.01.2023
Elsevier BV
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