Gradient residual stress induced elastic deformation of multilayer MEMS structures

Multilayered structures are widely used as sensing or actuating components in MEMS devices. Since the thin films of multilayered structures are always subject to residual stresses, it is important to model the relation between these residual stresses and the resultant elastic deformation. The main p...

Full description

Saved in:
Bibliographic Details
Published inSensors and actuators. A. Physical. Vol. 134; no. 1; pp. 177 - 185
Main Authors Huang, Shusen, Zhang, Xin
Format Journal Article
LanguageEnglish
Published Elsevier B.V 28.02.2007
Subjects
Online AccessGet full text

Cover

Loading…