Liu, Y., Wang, Y., Fan, Z., Bai, G., & Chen, X. (2021). Reliability modeling and a statistical inference method of accelerated degradation testing with multiple stresses and dependent competing failure processes. Reliability engineering & system safety, 213, 107648. https://doi.org/10.1016/j.ress.2021.107648
Chicago Style (17th ed.) CitationLiu, Yao, Yashun Wang, Zhengwei Fan, Guanghan Bai, and Xun Chen. "Reliability Modeling and a Statistical Inference Method of Accelerated Degradation Testing with Multiple Stresses and Dependent Competing Failure Processes." Reliability Engineering & System Safety 213 (2021): 107648. https://doi.org/10.1016/j.ress.2021.107648.
MLA (9th ed.) CitationLiu, Yao, et al. "Reliability Modeling and a Statistical Inference Method of Accelerated Degradation Testing with Multiple Stresses and Dependent Competing Failure Processes." Reliability Engineering & System Safety, vol. 213, 2021, p. 107648, https://doi.org/10.1016/j.ress.2021.107648.