Repetition-frequency-tunable mode-locked surface emitting semiconductor laser between 2.78 and 7.87 GHz
We report a repetition frequency tunable, passively mode-locked vertical-external-cavity surface-emitting semiconductor laser (VECSEL) with continuous repetition frequency tuning between 2.78 and 7.87 GHz using mechanical tuning of the laser cavity length. The laser emits near-transform-limited, sub...
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Published in | Optics express Vol. 19; no. 23; pp. 23453 - 23459 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
United States
07.11.2011
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Abstract | We report a repetition frequency tunable, passively mode-locked vertical-external-cavity surface-emitting semiconductor laser (VECSEL) with continuous repetition frequency tuning between 2.78 and 7.87 GHz using mechanical tuning of the laser cavity length. The laser emits near-transform-limited, sub-500-fs pulses over almost an octave tuning range between 2.78 and 5 GHz. At repetition rates above 6 GHz the pulse duration increases to ~2.5 ps. Over the entire tuning range the laser emits an average output power of 40 ± 5 mW in a fundamental transverse mode. The change in pulse duration highlights a change in the dominant modelocking mechanism which forms the pulses. At high repetition frequencies the pulse duration is set by the saturable absorber recovery time. At low repetition frequencies the fluence and peak intensity on the SESAM increases to a point where the fast pulse shaping mechanisms of the optical Stark effect and carrier thermalization dominate the pulse shortening. |
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AbstractList | We report a repetition frequency tunable, passively mode-locked vertical-external-cavity surface-emitting semiconductor laser (VECSEL) with continuous repetition frequency tuning between 2.78 and 7.87 GHz using mechanical tuning of the laser cavity length. The laser emits near-transform-limited, sub-500-fs pulses over almost an octave tuning range between 2.78 and 5 GHz. At repetition rates above 6 GHz the pulse duration increases to ~2.5 ps. Over the entire tuning range the laser emits an average output power of 40 ± 5 mW in a fundamental transverse mode. The change in pulse duration highlights a change in the dominant modelocking mechanism which forms the pulses. At high repetition frequencies the pulse duration is set by the saturable absorber recovery time. At low repetition frequencies the fluence and peak intensity on the SESAM increases to a point where the fast pulse shaping mechanisms of the optical Stark effect and carrier thermalization dominate the pulse shortening. |
Author | Quarterman, Adrian H Beere, Harvey E Wilcox, Keith G Ritchie, David A Tropper, Anne C |
Author_xml | – sequence: 1 givenname: Keith G surname: Wilcox fullname: Wilcox, Keith G email: K.G.Wilcox@soton.ac.uk organization: School of Physics and Astronomy, University of Southampton, Southampton, SO17 1BJ, UK. K.G.Wilcox@soton.ac.uk – sequence: 2 givenname: Adrian H surname: Quarterman fullname: Quarterman, Adrian H – sequence: 3 givenname: Harvey E surname: Beere fullname: Beere, Harvey E – sequence: 4 givenname: David A surname: Ritchie fullname: Ritchie, David A – sequence: 5 givenname: Anne C surname: Tropper fullname: Tropper, Anne C |
BackLink | https://www.ncbi.nlm.nih.gov/pubmed/22109222$$D View this record in MEDLINE/PubMed |
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CitedBy_id | crossref_primary_10_1063_1_5045650 crossref_primary_10_1038_lsa_2015_83 crossref_primary_10_1364_OE_20_007040 crossref_primary_10_1016_j_optcom_2014_02_003 crossref_primary_10_7498_aps_73_20240441 crossref_primary_10_1364_OE_22_016445 crossref_primary_10_1364_OE_22_012096 crossref_primary_10_1109_LPT_2016_2517650 crossref_primary_10_1364_OE_22_006099 crossref_primary_10_1088_1612_202X_aca97e crossref_primary_10_1364_AOP_8_000370 crossref_primary_10_1364_OE_21_001599 crossref_primary_10_1364_OE_21_025526 |
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Title | Repetition-frequency-tunable mode-locked surface emitting semiconductor laser between 2.78 and 7.87 GHz |
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