Çinar, S., & Acir, N. (2017). A novel system for automatic removal of ocular artefacts in EEG by using outlier detection methods and independent component analysis. Expert systems with applications, 68, 36-44. https://doi.org/10.1016/j.eswa.2016.10.009
Chicago Style (17th ed.) CitationÇinar, Salim, and Nurettin Acir. "A Novel System for Automatic Removal of Ocular Artefacts in EEG by Using Outlier Detection Methods and Independent Component Analysis." Expert Systems with Applications 68 (2017): 36-44. https://doi.org/10.1016/j.eswa.2016.10.009.
MLA (9th ed.) CitationÇinar, Salim, and Nurettin Acir. "A Novel System for Automatic Removal of Ocular Artefacts in EEG by Using Outlier Detection Methods and Independent Component Analysis." Expert Systems with Applications, vol. 68, 2017, pp. 36-44, https://doi.org/10.1016/j.eswa.2016.10.009.