Spurious activation and operational integrity evaluation of redundant safety instrumented systems

• Published in: Reliability engineering & system safety Vol. 197; pp. 106785 - 17
• Main Authors: Qi, Meng, Kan, Yufeng, Li, Xun, Wang, Xiaoying, Zhao, Dongfeng, Moon, Il
• Format: Journal Article
• Language: English
• Published: Barking Elsevier Ltd 01.05.2020; Elsevier BV
• Subjects: Activation; Common cause failure (CCF); Common cause failures; Configurations; Economic impact; Integrity; Mathematical analysis; Optimal configurations; Reliability engineering; Risk management; Risk reduction; Safety; Safety instrumented system (SIS); Solvers; Spurious activation; Spurious trip rate (STR); Subsystems; Spurious activation; Optimal configurations; Spurious trip rate (STR); Common cause failure (CCF); Safety instrumented system (SIS)

•Possible scenarios leading to a spurious trip in SIS subsystems are analyzed.•A set of formulas is proposed to estimate the STR for any KooN configuration.•Investigation on the operational integrity of the SIS using numerical calculations.•Optimal KooN configurations are identified with both lower...