Simulation and analysis of the optical performance of silicon nanowire arrays

It is the basic operating principle of many optoelectronic sensors with using semiconductor materials to detect light waves for achieving efficient photoelectric conversion. At present, how to maximize the light absorption of materials in broad spectrum becomes one of the key subjects in optical sen...

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Published inJournal of physics. Conference series Vol. 2652; no. 1; pp. 12001 - 12009
Main Authors Wang, Shanshan, Zhang, Yan, Zhu, Liping
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.11.2023
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Abstract It is the basic operating principle of many optoelectronic sensors with using semiconductor materials to detect light waves for achieving efficient photoelectric conversion. At present, how to maximize the light absorption of materials in broad spectrum becomes one of the key subjects in optical sensing field. In this paper, the antireflective properties of silicon nanowire arrays is analyzed by means of the subwavelength grating principle and the effective medium theory, and the influence of structural parameters on the reflectivity of micro/nano structured arrays under broad spectrum irradiation is simulated by finite difference time domain solutions simulation software system. Theoretical calculation can get knowledge of the variation regularity of diffraction order of micro/nano films. Simulation result can provide theoretical reference for later specific experiments of realizing the morphology evolution of arrays. Combination of two steps, the appearance of higher-order diffraction light can be controlled by changing the structural parameters so as to improve the antireflective properties of micro/nano structured arrays.
AbstractList It is the basic operating principle of many optoelectronic sensors with using semiconductor materials to detect light waves for achieving efficient photoelectric conversion. At present, how to maximize the light absorption of materials in broad spectrum becomes one of the key subjects in optical sensing field. In this paper, the antireflective properties of silicon nanowire arrays is analyzed by means of the subwavelength grating principle and the effective medium theory, and the influence of structural parameters on the reflectivity of micro/nano structured arrays under broad spectrum irradiation is simulated by finite difference time domain solutions simulation software system. Theoretical calculation can get knowledge of the variation regularity of diffraction order of micro/nano films. Simulation result can provide theoretical reference for later specific experiments of realizing the morphology evolution of arrays. Combination of two steps, the appearance of higher-order diffraction light can be controlled by changing the structural parameters so as to improve the antireflective properties of micro/nano structured arrays.
Author Zhu, Liping
Wang, Shanshan
Zhang, Yan
Author_xml – sequence: 1
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  fullname: Zhang, Yan
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  givenname: Liping
  surname: Zhu
  fullname: Zhu, Liping
  organization: Information Center of China North Industries Group Corporation , China
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Snippet It is the basic operating principle of many optoelectronic sensors with using semiconductor materials to detect light waves for achieving efficient...
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SubjectTerms Antireflective properties
Arrays
Diffraction order
Effective medium theory
Electromagnetic absorption
Finite difference time domain solutions
Light diffraction
Mathematical analysis
Nanowires
Optical properties
Optoelectronic devices
Parameters
Photoelectricity
Physics
Principles
Semiconductor materials
Silicon
Silicon nanowire arrays
Simulation
Subwavelength grating principle
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Title Simulation and analysis of the optical performance of silicon nanowire arrays
URI https://iopscience.iop.org/article/10.1088/1742-6596/2652/1/012001
https://www.proquest.com/docview/2899098527
Volume 2652
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